H03K 3/027

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2024/0333,273 PIPELINE CLOCK DRIVING CIRCUIT, COMPUTING CHIP, HASHBOARD, AND COMPUTING DEVICEJan 12, 24Oct 03, 24SHENZHEN MICROBT ELECTRONICS TECHNOLOGY CO., LTD.
2024/0072,775 MULTI-LEVEL PULSER CIRCUIT AND METHOD OF OPERATING A MULTI-LEVEL PULSER CIRCUITSep 13, 23Feb 29, 24SMI STMicroelectronics S.r.l
2023/0124,622 Alarm Systems and CircuitsOct 14, 21Apr 20, 23Not available
2022/0271,740 MULTI-LEVEL PULSER CIRCUIT AND METHOD OF OPERATING A MULTI-LEVEL PULSER CIRCUITFeb 18, 22Aug 25, 22SMI STMicroelectronics S.r.l
2020/0395,926 PROGRAMMABLE DELAY CIRCUITJun 09, 20Dec 17, 20STMicroelectronics International N.V.
2020/0313,658 OUTPUT CIRCUIT, CIRCUIT DEVICE, OSCILLATOR, ELECTRONIC APPARATUS, AND VEHICLEMar 27, 20Oct 01, 20SEIKO EPSON CORPORATION
2020/0044,629 OSCILLATOR CIRCUIT AND METHOD FOR GENERATING A CLOCK SIGNALOct 19, 17Feb 06, 20Not available
2019/0372,559 CLOCK PULSE GENERATION CIRCUITAug 19, 19Dec 05, 19Not available
2019/0341,912 SEMICONDUCTOR APPARATUSJul 19, 19Nov 07, 19SK HYNIX INC.
2018/0302,065 SEMICONDUCTOR APPARATUSDec 01, 17Oct 18, 18SK HYNIX INC.
2016/0191,025 INTERFACE DEVICE, RELATED METHOD, AND RELATED OPEN-DRAIN DEVICEDec 07, 15Jun 30, 16SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION
2016/0182,020 RESET SELECTION CELL TO MITIGATE INITIALIZATION TIMEDec 23, 14Jun 23, 16TEXAS INSTRUMENTS INCORPORATED
2015/0054,669 ENCODER INPUT DEVICEMar 02, 12Feb 26, 15MITSUBISHI ELECTRIC CORPORATION
2013/0271,197 POWER DROOP REDUCTION VIA CLOCK-GATING FOR AT-SPEED SCAN TESTINGApr 11, 12Oct 17, 13NVIDIA CORPORATION
2013/0265,090 APPARATUSES, CIRCUITS, AND METHODS FOR REDUCING METASTABILITY IN DATA SYNCHRONIZATIONApr 10, 12Oct 10, 13MICRON TECHNOLOGY, INC.
2013/0063,195 DIGITAL INPUT BUFFERMay 09, 12Mar 14, 13STMICROELECTRONICS, INC.
2013/0009,673 ADAPTIVE BODY BIAS CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT INCLUDING THE SAMEMay 31, 12Jan 10, 13SAMSUNG ELECTRONICS CO., LTD.
2012/0212,272 SEMICONDUCTOR DEVICE HAVING PLURAL PENETRATION ELECTRODES PENETRATING THROUGH SEMICONDUCTOR SUBSTRATE AND TESTING METHOD THEREOFFeb 16, 12Aug 23, 12LONGITUDE SEMICONDUCTOR S.A.R.L.
2012/0206,172 INTERNAL POWER SUPPLY VOLTAGE GENERATION CIRCUITFeb 13, 12Aug 16, 12SEIKO INSTRUMENTS INC.
2011/0309,882 Method and circuit for operating a power semiconductor componentApr 20, 11Dec 22, 11GE ENERGY POWER CONVERSION TECHNOLOGY LTD.

Showing 1 to 20 of 25 results