| 2018/0117,362 | ION BEAM EXTRACTION APPARATUS AND METHOD OF USE THEREOF | Dec 19, 17 | May 03, 18 | Not available |
| 2018/0001,110 | GUIDED CHARGED PARTICLE IMAGING/TREATMENT APPARATUS AND METHOD OF USE THEREOF | Sep 15, 17 | Jan 04, 18 | Not available |
| 2016/0314,867 | A PLASMON GENERATOR | Nov 28, 14 | Oct 27, 16 | KING'S COLLEGE LONDON, MAX-PLANCK-GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN E.V., |
| 2016/0078,975 | Method and Technique to Control Laser Effects Through Tuning of Parameters Such as Repetition Rate | Nov 23, 15 | Mar 17, 16 | PM & AM RESEARCH |
| 2015/0179,388 | LIMITING MIGRATION OF TARGET MATERIAL | Jun 14, 12 | Jun 25, 15 | EXCILLUM AB |
| 2015/0115,179 | CHARGED PARTICLE BEAM SYSTEM | Oct 27, 14 | Apr 30, 15 | HITACHI, LTD., NATIONAL UNIVERSITY CORPORATION HOKKAIDO UNIVERSITY, |
| 2015/0060,689 | Ions Metering Device for an Energy Storage Device, Method of Manufacturing a Metering Device and Ion Energy Storage Device | Aug 11, 14 | Mar 05, 15 | AIRBUS DEFENCE AND SPACE GMBH |
| 2014/0369,460 | METHOD AND APPARATUS FOR GENERATING X-RAYS IN COMPUTER TOMOGRAPHY SYSTEM | Oct 10, 13 | Dec 18, 14 | ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
| 2014/0231,679 | Method and Technique to Control Laser Effects Through Tuning of Parameters Such as Repetition Rate | Aug 06, 12 | Aug 21, 14 | PM & AM RESEARCH |
| 2014/0209,813 | MULTI-PARTICLE BEAM COLUMN HAVING AN ELECTRODE LAYER INCLUDING AN ECCENTRIC APERTURE | Jan 28, 13 | Jul 31, 14 | INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SUNMOON UNIVERSITY |
| 2014/0105,361 | Multiple Focal Spot X-Ray Radiation Filtering | May 30, 12 | Apr 17, 14 | KONINKLIJKE PHILIPS ELECTRONICS N V |
| 2013/0193,322 | PHASE PLATE | Dec 24, 12 | Aug 01, 13 | HITACHI HIGH-TECHNOLOGIES CORPORATION |
| 2013/0040,241 | Method and System for Charged Particle Beam Lithography | Aug 10, 12 | Feb 14, 13 | JEOL LTD. |
| 2012/0223,245 | ELECTRON BEAM SOURCE SYSTEM AND METHOD | Mar 01, 11 | Sep 06, 12 | Not available |
| 2012/0193,533 | Corrector | Feb 15, 11 | Aug 02, 12 | CEOS CORRECTED ELECTRON OPTICAL SYSTEMS GMBH |
| 2012/0181,444 | High-Vacuum Variable Aperture Mechanism And Method Of Using Same | Jan 14, 11 | Jul 19, 12 | KLA-TENCOR CORPORATION |
| 2012/0168,639 | HIGH GRADIENT LENS FOR CHARGED PARTICLE BEAM | Jan 04, 12 | Jul 05, 12 | LAWRENCE LIVERMORE NATIONAL SECURITY, LLC |
| 2012/0091,358 | PROJECTION LENS ARRANGEMENT | Oct 15, 10 | Apr 19, 12 | MAPPER LITHOGRAPHY IP B.V. |
| 2012/0025,094 | CHARGED PARTICLE BEAM SYSTEM | Jul 26, 11 | Feb 02, 12 | CARL ZEISS MICROSCOPY GMBH |
| 2011/0284,759 | METHOD FOR ADJUSTING OPTICAL AXIS OF CHARGED PARTICLE RADIATION AND CHARGED PARTICLE RADIATION DEVICE | Jan 13, 10 | Nov 24, 11 | HITACHI HIGH-TECHNOLOGIES CORPORATION |