2025/0102,539 | PROBE SYSTEM AND MACHINE APPARATUS THEREOF | Dec 09, 24 | Mar 27, 25 | Not available |
2024/0361,362 | CURRENT SENSOR | Jul 09, 24 | Oct 31, 24 | Not available |
2024/0235,708 | ENCLOSURE FOR TESTING ELECTRONIC DEVICES | Sep 19, 23 | Jul 11, 24 | Promptlink Communications, Inc. |
2024/0219,450 | APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION | Dec 29, 22 | Jul 04, 24 | Not available |
2024/0151,745 | Ground Reference Lead | Nov 07, 22 | May 09, 24 | Not available |
2024/0090,122 | METHOD FOR SHIELDING A PRINTED CIRCUIT BOARD FROM ELECTROMAGNETIC INTERFERENCE AND NOISE DURING TESTING | Jul 26, 23 | Mar 14, 24 | Not available |
2023/0142,008 | CURRENT SENSOR ASSEMBLY | Apr 27, 20 | May 11, 23 | LG Magna e-Powertrain Co., Ltd. |
2021/0080,487 | ELECTROMAGNETIC SHIELDING DURING WAFER STAGE TESTING | Sep 16, 19 | Mar 18, 21 | Not available |
2020/0241,087 | CABLE CONDITION MONITORING SENSOR DEVICE METHOD | Apr 16, 20 | Jul 30, 20 | Not available |
2020/0141,981 | CURRENT SENSING COIL ELECTROSTATIC SHIELDING | Oct 23, 19 | May 07, 20 | Not available |
2020/0057,094 | MINIATURE TEST PROBE | Aug 14, 18 | Feb 20, 20 | Not available |
2019/0113,540 | Enclosure for testing electronic devices | Oct 12, 18 | Apr 18, 19 | Promptlink Communications, Inc. |
2019/0107,559 | INPUT BUFFER AND NOISE CANCELLATION METHOD THEREOF | Dec 20, 17 | Apr 11, 19 | Not available |
2018/0328,962 | Shielded Probe Tip Interface | Aug 25, 17 | Nov 15, 18 | Not available |
2018/0321,283 | CURRENT SENSOR | Apr 23, 18 | Nov 08, 18 | Yazaki Corporation |
2018/0100,876 | ELECTROMAGNETIC SHIELD FOR TESTING INTEGRATED CIRCUITS | Dec 12, 17 | Apr 12, 18 | STMicroelectronics S.r.l. |
2018/0031,608 | SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS | Oct 05, 17 | Feb 01, 18 | CASCADE MICROTECH, INC. |
2017/0292,974 | SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS | Apr 08, 16 | Oct 12, 17 | CASCADE MICROTECH, INC. |
2017/0292,975 | TEST BLOCK WITH FARADAY CAGE | Apr 07, 17 | Oct 12, 17 | ABB SCHWEIZ AG |
2017/0205,446 | SHIELDED PROBE SYSTEMS | Jan 15, 16 | Jul 20, 17 | CASCADE MICROTECH, INC. |