G01R 1/073

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2025/0116,685 PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHODOct 24, 22Apr 10, 25Not available
2025/0116,686 MEASURING DEVICEJun 14, 21Apr 10, 25Fuji Corporation
2025/0110,153 PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOFDec 22, 23Apr 03, 25Not available
2025/0110,154 PROBE CARD DEVICEDec 13, 23Apr 03, 25Not available
2025/0110,177 CHARGE/DISCHARGE INSPECTION DEVICE AND CHARGE/DISCHARGE INSPECTION EQUIPMENTDec 13, 24Apr 03, 25Not available
2025/0102,540 PROBE ASSEMBLY WITH MULTIPLE SPACERS AND METHODS OF ASSEMBLING THE SAMEDec 08, 24Mar 27, 25Not available
2025/0093,384 PROBER, PERFORMANCE BOARD, PROBE CARD, AND SUBSTRATE INSPECTING APPARATUSAug 28, 24Mar 20, 25Kioxia Corporation
2025/0093,386 WAFER TESTING CASSETTEMar 29, 24Mar 20, 25Not available
2025/0093,412 PROBE STRUCTURE FOR MICRO DEVICE INSPECTIONDec 03, 24Mar 20, 25VueReal Inc.
2025/0093,385 PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF FORMING THE SAMENov 14, 23Mar 20, 25Not available
2025/0093,407 METHOD OF HAVING GOOD THERMAL ISOLATION IN WAFER TEST CASSETTEMar 29, 24Mar 20, 25Not available
2025/0085,309 LOW CROSS-TALK INTERCONNECTION DEVICE WITH IMPEDANCE-TUNED HYBRID SHIELDING STRUCTURES FOR INTEGRATED CIRCUIT DEVICE TEST TOOLINGMay 20, 24Mar 13, 25Not available
2025/0085,311 COMPOSITE PROBE, METHOD FOR ATTACHING PROBE, AND METHOD FOR MANUFACTURING PROBE CARDMar 16, 22Mar 13, 25Japan Electronic Materials Corporation
2025/0087,526 SEMICONDUCTOR MANUFACTURING APPARATUSFeb 08, 24Mar 13, 25Not available
2025/0076,342 Apparatus, System and Method for Repairing a Test Contact ArrangementMar 16, 23Mar 06, 25Not available
2025/0076,366 SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEMAug 27, 24Mar 06, 25Advantest Corporation
2025/0076,372 INSPECTION METHOD AND INSPECTION APPARATUSAug 19, 24Mar 06, 25Not available
2025/0067,776 PROBE DEVICES AND PROBE CONTROL APPARATUSDec 19, 22Feb 27, 25Not available
2025/0071,889 FLEXIBLE CIRCUIT BOARDJul 31, 24Feb 27, 25Not available
2025/0060,405 TESTING MODULEOct 09, 24Feb 20, 25Not available

Showing 1 to 20 of 1031 results