| 2025/0060,407 | TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUIT | Feb 06, 24 | Feb 20, 25 | Not available |
| 2025/0007,176 | APPARATUS OF MULTIFREQUENCY ELECTROMAGNETIC RESONATORS INDUCTIVELY COUPLED TO ONE ANOTHER FORMING AN ARRAY OF RESONATORS OR A METAMATERIAL, AND IMPLEMENTATION METHOD | Nov 18, 22 | Jan 02, 25 | UNIVERSITE PARIS-SACLAY; Centre National De La Recherche Scientifique (CNRS); CY CERGY PARIS UNIVERSITÉ; |
| 2024/0393,365 | ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENT | Dec 19, 22 | Nov 28, 24 | Not available |
| 2024/0369,599 | PROBE CARD DEVICE | Apr 30, 24 | Nov 07, 24 | Silicon Future Manufacturing Company Ltd. |
| 2024/0361,362 | CURRENT SENSOR | Jul 09, 24 | Oct 31, 24 | Not available |
| 2024/0230,718 | VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS | Oct 24, 22 | Jul 11, 24 | Not available |
| 2024/0219,452 | METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENABLING MICROPROCESSOR DEBUG, AT HIGH SPEED, INSIDE AN ELECTRON BEAM PROBE | Dec 28, 22 | Jul 04, 24 | Not available |
| 2024/0133,921 | VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS | Oct 23, 22 | Apr 25, 24 | Not available |
| 2024/0103,041 | INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITY | Sep 27, 23 | Mar 28, 24 | Not available |
| 2024/0085,493 | FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METHOD THEREFOR | Oct 21, 21 | Mar 14, 24 | INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG |
| 2024/0044,980 | MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEM | Oct 19, 23 | Feb 08, 24 | Not available |
| 2023/0168,278 | SUBSTRATE PROCESSING APPARATUS | Sep 09, 22 | Jun 01, 23 | Not available |
| 2023/0133,953 | APPARATUS AND SYSTEM FOR GENERATING MAGNETIC FIELDS IN INACCESSIBLE REGIONS | Oct 21, 21 | May 04, 23 | Not available |
| 2022/0413,012 | REMOVABLE CONTACTLESS PROBE | Jun 29, 21 | Dec 29, 22 | Not available |
| 2021/0208,182 | PROBE CARD, PROBING SYSTEM AND PROBING METHOD | Feb 06, 20 | Jul 08, 21 | Not available |
| 2021/0132,115 | PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATORS, AND RELATED METHODS | Oct 23, 20 | May 06, 21 | Not available |
| 2021/0080,295 | Integrated Optical/Electrical Probe Card for Testing Optical, Electrical, and Optoelectronic Devices in a Semiconductor Die | Sep 13, 19 | Mar 18, 21 | Newport Fab, LLC dba Jazz Semiconductor |
| 2021/0033,643 | ELECTRO-OPTICAL CIRCUIT BOARD FOR CONTACTING PHOTONIC INTEGRATED CIRCUITS | Oct 05, 20 | Feb 04, 21 | Not available |
| 2020/0348,340 | CONTACTLESS TESTING OF ELECTRONIC CIRCUITS | Aug 28, 19 | Nov 05, 20 | Not available |
| 2020/0124,638 | STRUCTURE AND METHODOLOGY FOR DETERMINING TEST PAD INTEGRITY | Oct 18, 18 | Apr 23, 20 | Not available |