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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2020/0292,574 MULTILEVEL TRIGGERING SYSTEM FOR OUTPUTTING COMPLEX TRIGGER SIGNALMay 29, 20Sep 17, 20Not available
2018/0292,439 METHOD AND APPARATUS FOR DETECTING AN ENERGIZED E-FIELDJun 14, 18Oct 11, 18Not available
2015/0137,839 FLEXIBLE TEST SITE SYNCHRONIZATIONNov 19, 13May 21, 15ADVANTEST CORPORATION
2014/0184,255 MECHANISM FOR FACILITATING MODULAR PROCESSING CELL FRAMEWORK AND APPLICATION FOR ASYNCHRONOUS PARALLEL SINGULATED SEMICONDUCTOR DEVICE HANDLING AND TESTINGDec 28, 12Jul 03, 14INTEL CORPORATION
2014/0058,692 MULTILEVEL TRIGGERING SYSTEM FOR OUTPUTTING COMPLEX TRIGGER SIGNALJul 22, 13Feb 27, 14KEYSIGHT TECHNOLOGIES, INC.
2013/0119,974 SYSTEM AND METHOD FOR TAMPER DETECTION IN A UTILITY METERNov 14, 11May 16, 13ACLARA METERS LLC
2013/0082,718 CIRCUIT TEST INTERFACE AND TEST METHOD THEREOFOct 04, 11Apr 04, 13NANYA TECHNOLOGY CORPORATION
2013/0082,684 VOLTAGE MONITOROct 04, 11Apr 04, 13ANALOG DEVICES, INC.
2013/0076,340 REED SWITCH CHAIN TO DETECT METER TAMPERINGSep 23, 11Mar 28, 13GENERAL ELECTRIC COMPANY
2013/0069,669 ELECTROSTATIC SHIELDING TECHNIQUE ON HIGH VOLTAGE DIODESSep 19, 11Mar 21, 13HONEYWELL INTERNATIONAL INC.
2013/0043,882 APPARATUS AND METHOD FOR TESTING ELECTRONIC EQUIPMENTAug 19, 11Feb 21, 13TELEPLAN INTERNATIONAL NV
2013/0027,073 INTEGRATED CIRCUIT COMPRISING AT LEAST AN INTEGRATED ANTENNAJul 27, 12Jan 31, 13STMICROELECTRONICS S.R.L.
2012/0326,727 COMPOUND TEST METHOD OF HIGH VOLTAGE DIRECT CURRENT TRANSMISSION CONVERTER VALVEJun 16, 11Dec 27, 12Not available
2012/0262,153 APPARATUS AND METHOD FOR MEASURING ELECTRICAL PARAMETERS OF CIRCUITMar 16, 12Oct 18, 12NATIONAL CHENG KUNG UNIVERSITY
2012/0242,498 USER ACKNOWLEDGEMENT DEVICE IN ELECTRONIC UTILITY METERMar 21, 11Sep 27, 12GENERAL ELECTRIC COMPANY
2012/0098,522 NON-CONTACT VOLTAGE DETECTOROct 25, 11Apr 26, 12Grace Engineered Products, Inc.
2012/0074,927 Electronic Tamper Detection in a Utility Meter Using MagneticsSep 02, 11Mar 29, 12LANDIS+GYR LLC, LANIDS+GYR, INC.,
2011/0273,186 CIRCUIT FOR CONTROLLING TEMPERATURE AND ENABLING TESTING OF A SEMICONDUCTOR CHIPMay 06, 10Nov 10, 11TEXAS INSTRUMENTS INCORPORATED
2011/0215,810 VOLTAGE MONITORING SYSTEM, VOLTAGE MONITORING DEVICE, AND METHOD OF SETTING INFORMATIONFeb 23, 11Sep 08, 11LAPIS SEMICONDUCTOR CO., LTD.
2011/0193,548 SEPARATION-TYPE AVOMETERFeb 05, 10Aug 11, 11APPA TECHNOLOGY CORP.

Showing 1 to 20 of 486 results