G01Q 40/02

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2024/0241,151 SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLATE QUALIFICATION TOOLMay 18, 22Jul 18, 24Not available
2024/0219,826 METHOD OF REMOVING DEFECT OF MASKNov 29, 23Jul 04, 24Samsung Electronics Co., Ltd.
2024/0210,443 FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIPApr 28, 22Jun 27, 24Not available
2024/0110,939 AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAMEFeb 09, 22Apr 04, 24Not available
2024/0069,064 PROBE ASSESSMENT METHOD AND SPMJun 09, 21Feb 29, 24Shimadzu Corporation
2023/0228,792 STANDARD SAMPLE AND MANUFACTURING METHOD THEREOFMay 14, 20Jul 20, 23Not available
2020/0318,957 REFERENCE-STANDARD DEVICE FOR CALIBRATION OF MEASUREMENTS OF LENGTH, AND CORRESPONDING CALIBRATION PROCESSMay 19, 17Oct 08, 20Not available
2019/0025,340 DETERMINING INTERACTION FORCES IN A DYNAMIC MODE AFM DURING IMAGINGAug 17, 16Jan 24, 19Not available
2016/0069,929 CALIBRATION STANDARD WITH PRE-DETERMINED FEATURESApr 17, 13Mar 10, 16Not available
2014/0317,791 NANOMETER STANDARD PROTOTYPE AND METHOD FOR MANUFACTURING NANOMETER STANDARD PROTOTYPENov 11, 11Oct 23, 14KWANSEI GAKUIN EDUCATIONAL FOUNDATION
2010/0313,312 Method and Apparatus for Characterizing a Probe TipFeb 20, 07Dec 09, 10VEECO INSTRUMENTS INC.