| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0295,583 | POSITIONING SYSTEM AND METHOD | Jan 24, 22 | Sep 05, 24 | Not available |
| 2024/0210,442 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0168,052 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Mar 26, 21 | May 23, 24 | Not available |
| 2024/0118,310 | DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE | Jan 20, 22 | Apr 11, 24 | Not available |
| 2023/0194,567 | METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Aug 01, 22 | Jun 22, 23 | Samsung Electronics Co., Ltd.; Korea Advanced Institute of Science and Technology; |
| 2020/0141,970 | SCANNING PROBE MICROSCOPE | Jun 28, 18 | May 07, 20 | Not available |
| 2019/0383,854 | CALIBRATING TIP-ENHANCED RAMAN MICROSCOPES | Jun 17, 18 | Dec 19, 19 | Not available |
| 2018/0275,165 | METHOD FOR CALIBRATING AND IMAGING USING MULTI-TIP SCANNING PROBE MICROSCOPE | May 09, 17 | Sep 27, 18 | FEI Company |
| 2018/0267,081 | MEASUREMENT SYSTEM | Mar 20, 17 | Sep 20, 18 | Not available |
| 2017/0313,583 | Thermal Measurements Using Multiple Frequency Atomic Force Microscopy | Mar 28, 17 | Nov 02, 17 | Not available |
| 2016/0025,772 | ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING | Oct 02, 15 | Jan 28, 16 | SEAGATE TECHNOLOGY LLC |
| 2016/0003,866 | Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Microscope, And Method For Controlling The Distance Between The Local Probe And The Sample | Jan 13, 14 | Jan 07, 16 | CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE POLYTECHNIQUE, |
| 2015/0309,071 | AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy | Apr 23, 15 | Oct 29, 15 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
| 2015/0301,079 | PROBE CALIBRATION OR MEASUREMENT ROUTINE | Nov 29, 13 | Oct 22, 15 | INFINITESIMA LIMITED |
| 2015/0293,145 | CALIBRATION OF A MECHANICAL PROPERTY OF SPM CANTILEVERS | Mar 22, 13 | Oct 15, 15 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 2015/0060,654 | CHARGED PARTICLE BEAM DEVICE AND ARITHMETIC DEVICE | Dec 17, 12 | Mar 05, 15 | HITACHI HIGH-TECHNOLOGIES CORPORATION |
| 2015/0013,037 | Thermal Measurements Using Multiple Frequency Atomic Force Microscopy | Mar 25, 14 | Jan 08, 15 | ASYLUM RESEARCH CORPORATION |
| 2015/0013,038 | PROBE CALIBRATION | Dec 21, 12 | Jan 08, 15 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 2013/0166,240 | Pattern Dimension Measurement Method Using Electron Microscope, Pattern Dimension Measurement System, and Method for Monitoring Changes in Electron Microscope Equipment Over Time | May 20, 11 | Jun 27, 13 | HITACHI HIGH-TECHNOLOGIES CORPORATION |