G01Q 30/18

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2019/0293,680 SCANNING PROBE MICROSCOPEJun 02, 16Sep 26, 19Shimadzu Corporation
2019/0025,339 HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELIUM-FREE ROOM-TEMPERATURE BORE SUPERCONDUCTING MAGNETDec 16, 16Jan 24, 19Fudan University
2014/0304,861 LEVELING APPARATUS AND ATOMIC FORCE MICROSCOPE INCLUDING THE SAMEApr 02, 14Oct 09, 14Park Systems Corp.
2013/0212,750 ZERO THERMAL EXPANSION, LOW HEAT TRANSFER, VARIABLE TEMPERATURE SAMPLE ASSEMBLY FOR PROBE MICROSCOPYSep 19, 12Aug 15, 13THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE