G01Q 30/12

Technology



back to "G01Q 30/12" profile

More Results

Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2020/0379,005 FORCE MICROSCOPE WITH HELIUM ATMOSPHEREApr 24, 18Dec 03, 20Not available
2016/0003,867 ATOMIC FORCE MICROSCOPE DRYING SYSTEM AND ATOMIC FORCE MICROSCOPEFeb 19, 15Jan 07, 16NATIONAL TSING HUA UNIVERSITY
2015/0226,766 APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPYJul 05, 13Aug 13, 15BRUKER NANO, INC., IMEC,