G01Q 30/10

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2024/0272,196 SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA PIEZO-PROBESSep 22, 22Aug 15, 24Not available
2021/0325,429 INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN ATOM-DEFINED STRUCTURESJun 29, 21Oct 21, 21QUANTUM SILICON INC.; National Research Council of Canada; The University of British Columbia;
2020/0166,540 Low Drift System for a Metrology InstrumentNov 26, 19May 28, 20Not available
2019/0317,125 MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND PRESSURE CONTROLLING SYSTEM OF THE STAGEApr 16, 19Oct 17, 19Not available
2019/0310,283 Cryogenic Cooling SystemMay 26, 17Oct 10, 19Oxford Instruments Nanotechnology Tools Limited
2019/0219,608 SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULEMay 18, 17Jul 18, 19Not available
2017/0168,089 Modular Atomic Force Microscope with Environmental ControlsFeb 28, 17Jun 15, 17Not available
2015/0074,859 Low Drift Scanning Probe MicroscopeOct 21, 14Mar 12, 15BRUKER NANO, INC.