| 2025/0069,843 | Detection of Probabilistic Process Windows | Nov 11, 24 | Feb 27, 25 | Fractilia, LLC |
| 2025/0004,010 | ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME | Dec 23, 22 | Jan 02, 25 | Not available |
| 2024/0312,757 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | May 24, 24 | Sep 19, 24 | Fractilia, LLC |
| 2024/0295,583 | POSITIONING SYSTEM AND METHOD | Jan 24, 22 | Sep 05, 24 | Not available |
| 2024/0258,066 | Method of Dispositioning and Control of a Semiconductor Manufacturing Process | Jan 17, 24 | Aug 01, 24 | Fractilia, LLC |
| 2024/0241,151 | SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLATE QUALIFICATION TOOL | May 18, 22 | Jul 18, 24 | Not available |
| 2024/0210,442 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Apr 28, 22 | Jun 27, 24 | Not available |
| 2023/0168,275 | METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCALE RESOLUTION | Feb 25, 22 | Jun 01, 23 | National Cheng Kung University |
| 2022/0326,277 | AFM Imaging with Metrology-Preserving Real Time Denoising | Apr 09, 21 | Oct 13, 22 | Not available |
| 2022/0155,339 | SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-SITU TIP CONDITIONING | Jan 22, 22 | May 19, 22 | QUANTUM SILICON INC.; The Governors of the University of Alberta; |
| 2022/0068,594 | DETECTION OF PROBABILISTIC PROCESS WINDOWS | Sep 10, 21 | Mar 03, 22 | Fractilia, LLC |
| 2021/0373,045 | SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-SITU TIP CONDITIONING | Mar 19, 19 | Dec 02, 21 | Quantum Silicon Inc.; The Governors of the University of Alberta; |
| 2021/0327,675 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS | May 10, 21 | Oct 21, 21 | Fractilia, LLC |
| 2021/0066,027 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | Nov 13, 20 | Mar 04, 21 | Fractilia, LLC |
| 2021/0055,326 | SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD | Jan 29, 18 | Feb 25, 21 | Not available |
| 2020/0402,224 | Method for Analyzing Polymer Membrane | Jul 16, 18 | Dec 24, 20 | LG Chem, Ltd. |
| 2019/0369,138 | METHOD FOR ERROR CORRECTION IN SCANNING PROBE MICROSCOPY | Jul 12, 17 | Dec 05, 19 | Not available |
| 2019/0293,680 | SCANNING PROBE MICROSCOPE | Jun 02, 16 | Sep 26, 19 | Shimadzu Corporation |
| 2019/0277,882 | SCANNING PROBE MICROSCOPE AND SURFACE IMAGE CORRECTION METHOD | Nov 08, 18 | Sep 12, 19 | Shimadzu Corporation |
| 2018/0364,277 | A METHOD TO MEASURE NANOSCALE MECHANICAL PROPERTIES USING ATOMIC FORCE MICROSCOPY WITHOUT INITIALLY CHARACTERIZING CANTILEVER TIP GEOMETRY | Dec 08, 16 | Dec 20, 18 | Not available |