| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0418,746 | SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM | Mar 24, 22 | Dec 19, 24 | Not available |
| 2024/0369,594 | MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCESSING DEVICE USING THE SAME | Jun 01, 23 | Nov 07, 24 | Not available |
| 2024/0345,129 | DECOUPLED OPTICAL FORCE NANOSCOPY | Apr 12, 24 | Oct 17, 24 | Not available |
| 2024/0288,468 | METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD | Jun 21, 22 | Aug 29, 24 | Not available |
| 2024/0230,709 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Mar 26, 24 | Jul 11, 24 | Not available |
| 2024/0219,826 | METHOD OF REMOVING DEFECT OF MASK | Nov 29, 23 | Jul 04, 24 | Samsung Electronics Co., Ltd. |
| 2024/0175,895 | Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA) | Feb 02, 24 | May 30, 24 | BRUKER NANO, INC. |
| 2024/0168,052 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Mar 26, 21 | May 23, 24 | Not available |
| 2024/0012,022 | Atomic-force Microscopy for Identification of Surfaces | Sep 21, 23 | Jan 11, 24 | Not available |
| 2023/0251,285 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Mar 30, 23 | Aug 10, 23 | Not available |
| 2023/0194,566 | SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUNNELING SPECTROSCOPY | Dec 19, 22 | Jun 22, 23 | The Regents of the University of California |
| 2023/0184,807 | METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BETWEEN LAYERS OF A SEMICONDUCTOR SUBSTRATE, SCANNING PROBE MICROSCOPY SYSTEM AND COMPUTER PROGRAM | Nov 05, 21 | Jun 15, 23 | Not available |
| 2023/0143,659 | METHOD OF DETERMINING DIMENSIONS OF FEATURES OF A SUBSURFACE TOPOGRAPHY, SCANNING PROBE MICROSCOPY SYSTEM AND COMPUTER PROGRAM | Apr 01, 21 | May 11, 23 | Not available |
| 2022/0357,359 | INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER | Mar 28, 22 | Nov 10, 22 | Not available |
| 2022/0252,638 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | Apr 18, 22 | Aug 11, 22 | BRUKER NANO, INC. |
| 2022/0082,583 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Aug 12, 21 | Mar 17, 22 | Not available |
| 2021/0325,428 | PAN-SHARPENING FOR MICROSCOPY | Apr 16, 21 | Oct 21, 21 | Not available |
| 2021/0318,351 | METHOD FOR PROVIDING A PROBE DEVICE FOR SCANNING PROBE MICROSCOPY | Nov 13, 18 | Oct 14, 21 | Not available |
| 2021/0231,704 | Battery Electrode Analysis Method | Oct 15, 19 | Jul 29, 21 | LG Chem, Ltd. |