| 2025/0069,843 | Detection of Probabilistic Process Windows | Nov 11, 24 | Feb 27, 25 | Fractilia, LLC |
| 2024/0361,351 | METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY | Apr 26, 24 | Oct 31, 24 | Not available |
| 2024/0312,757 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | May 24, 24 | Sep 19, 24 | Fractilia, LLC |
| 2024/0288,468 | METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD | Jun 21, 22 | Aug 29, 24 | Not available |
| 2024/0280,605 | MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD | Feb 17, 23 | Aug 22, 24 | WINBOND ELECTRONICS CORP. |
| 2024/0280,606 | DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING METHOD | Feb 03, 22 | Aug 22, 24 | Not available |
| 2024/0258,066 | Method of Dispositioning and Control of a Semiconductor Manufacturing Process | Jan 17, 24 | Aug 01, 24 | Fractilia, LLC |
| 2024/0210,442 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0168,053 | Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR | Nov 20, 23 | May 23, 24 | Not available |
| 2024/0126,061 | SCANNING PROBE MICROSCOPE | Oct 16, 23 | Apr 18, 24 | Not available |
| 2023/0358,782 | NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING | Oct 27, 22 | Nov 09, 23 | Versitech Limited; City University of Hong Kong; |
| 2023/0236,221 | SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING INFRARED ABSORPTION SPECTRUM | Aug 05, 22 | Jul 27, 23 | Not available |
| 2023/0003,762 | DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HETERO-GENITY AND PURITY QUANTIFICATION OF EXTRACELLULAR VESICLES | Aug 15, 22 | Jan 05, 23 | Lua Optomekatronik ARGE A.S. |
| 2022/0244,290 | METHOD FOR ELECTRICALLY EXAMINING ELECTRONIC COMPONENTS OF AN INTEGRATED CIRCUIT | Nov 08, 19 | Aug 04, 22 | Not available |
| 2022/0206,039 | METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORCE MICROSCOPE | Dec 24, 21 | Jun 30, 22 | Park Systems Corp. |
| 2022/0178,965 | APPARATUS AND METHOD FOR EXAMINING AND/OR PROCESSING A SAMPLE | Feb 25, 22 | Jun 09, 22 | Not available |
| 2022/0068,594 | DETECTION OF PROBABILISTIC PROCESS WINDOWS | Sep 10, 21 | Mar 03, 22 | Fractilia, LLC |
| 2022/0026,462 | OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANNING TUNNELING MICROSCOPE SYSTEM, COMPUTING DEVICE, PROGRAM, AND COMPUTING METHOD | Nov 29, 19 | Jan 27, 22 | Not available |
| 2021/0389,345 | FREQUENCY TRACKING FOR SUBSURFACE ATOMIC FORCE MICROSCOPY | Oct 24, 19 | Dec 16, 21 | Not available |
| 2021/0341,385 | SYSTEM FOR MEASURING THE ABSORPTION OF A LASER EMISSION BY A SAMPLE | Sep 04, 19 | Nov 04, 21 | Not available |