2022/0043,024 | ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS | Oct 21, 21 | Feb 10, 22 | Cornell Research Foundation Inc. Cornell University |
2020/0204,112 | ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS | May 10, 18 | Jun 25, 20 | Cornell Research Foundation Inc. Cornell University |
2018/0321,277 | METROLOGY DEVICES FOR RAPID SPECIMEN SETUP | Nov 03, 16 | Nov 08, 18 | Not available |
2017/0356,931 | Scanning Probe System with Multiple Probes | Jun 08, 17 | Dec 14, 17 | INFINITESIMA LIMITED |
2015/0101,085 | COMPENSATION FOR CANONICAL SECOND ORDER SYSTEMS FOR ELIMINATING PEAKING AT THE NATURAL FREQUENCY AND INCREASING BANDWIDTH | Oct 08, 13 | Apr 09, 15 | JONIX LLC |
2015/0101,086 | FREQUENCY MEASURING AND CONTROL APPARATUS WITH INTEGRATED PARALLEL SYNCHRONIZED OSCILLATORS | Nov 21, 14 | Apr 09, 15 | RHK TECHNOLOGY, INC. |
2013/0174,300 | HIGH-SCAN RATE POSITIONER FOR SCANNED PROBE MICROSCOPY | Dec 17, 12 | Jul 04, 13 | MASSACHUSETTS INSTITUTE OF TECHNOLOGY |
2013/0125,269 | Method And Apparatus Of Tuning A Scanning Probe Microscope | Nov 12, 12 | May 16, 13 | BRUKER NANO, INC. |
2013/0014,296 | PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE | Mar 29, 11 | Jan 10, 13 | INFINITESIMA LIMITED |
2013/0007,929 | Frequency Measuring and Control Apparatus with Integrated Parallel Synchronized Oscillators | Mar 17, 11 | Jan 03, 13 | RHK TECHNOLOGY, INC. |
2011/0173,729 | Method for Automatically Loading a Probe Assembly | Mar 22, 11 | Jul 14, 11 | BRUKER NANO, INC. |
2010/0306,886 | Probe Microscope | May 28, 10 | Dec 02, 10 | HITACHI, LTD. |
2010/0263,096 | MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND SCANNING PROBE MICROSCOPE | Jul 24, 08 | Oct 14, 10 | JPK Instruments AG |
2010/0257,644 | Coupled Mass-Spring Systems and Imaging Methods for Scanning Probe Microscopy | Feb 13, 07 | Oct 07, 10 | THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
2010/0242,142 | SCANNING PROBE MICROSCOPE | Oct 18, 07 | Sep 23, 10 | UNIVERSITEIT TWENTE |
2010/0100,990 | HIGH-SCAN RATE POSITIONER FOR SCANNED PROBE MICROSCOPY | Oct 17, 09 | Apr 22, 10 | MASSACHUSETTS INSTITUTE OF TECHNOLOGY |