| 2024/0272,196 | SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA PIEZO-PROBES | Sep 22, 22 | Aug 15, 24 | Not available |
| 2024/0210,443 | FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIP | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0175,895 | Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA) | Feb 02, 24 | May 30, 24 | BRUKER NANO, INC. |
| 2024/0168,053 | Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR | Nov 20, 23 | May 23, 24 | Not available |
| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2022/0260,611 | CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING SCANNING PROBE MICROSCOPE | Apr 30, 20 | Aug 18, 22 | HITACHI HIGH-TECH CORPORATION |
| 2022/0252,638 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | Apr 18, 22 | Aug 11, 22 | BRUKER NANO, INC. |
| 2022/0120,783 | Method And Control Unit For Demodulation | Nov 12, 19 | Apr 21, 22 | Not available |
| 2022/0057,430 | SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD | Dec 03, 19 | Feb 24, 22 | Not available |
| 2021/0140,996 | Scanning Sensor Having a Spin Defect | Mar 14, 18 | May 13, 21 | Not available |
| 2020/0341,027 | Scanning Probe Microscope | Dec 27, 19 | Oct 29, 20 | Not available |
| 2019/0018,040 | Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample | Jun 12, 18 | Jan 17, 19 | Not available |
| 2016/0274,144 | Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample | Mar 22, 16 | Sep 22, 16 | BRUKER NANO, INC. |
| 2010/0306,885 | Cantilevers with Integrated Actuators for Probe Microscopy | Aug 09, 10 | Dec 02, 10 | GEORGIA TECH RESEARCH CORPORATION |
| 2010/0017,921 | DEVICE AND METHOD FOR THE MICROMECHANICAL POSITIONING AND HANDLING OF AN OBJECT | Jan 28, 08 | Jan 21, 10 | TECHNISCHE UNIVERSITAET ILMENAU |