| 2024/0426,870 | SCANNING PROBE MICROSCOPE | Mar 16, 22 | Dec 26, 24 | Not available |
| 2024/0369,595 | LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE | Jun 10, 22 | Nov 07, 24 | Not available |
| 2024/0295,583 | POSITIONING SYSTEM AND METHOD | Jan 24, 22 | Sep 05, 24 | Not available |
| 2024/0269,717 | DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES | Apr 22, 24 | Aug 15, 24 | Not available |
| 2024/0275,130 | LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCANNING MICROSCOPE DEVICE COMPRISING A LASER DIODE | Jul 08, 22 | Aug 15, 24 | Not available |
| 2024/0210,442 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2024/0077,516 | SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MAPPING | Aug 08, 23 | Mar 07, 24 | Not available |
| 2024/0069,095 | DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE MICROSCOPY | Aug 26, 22 | Feb 29, 24 | Not available |
| 2024/0012,021 | ATOMIC FORCE MICROSCOPE | Aug 18, 21 | Jan 11, 24 | Not available |
| 2023/0393,169 | ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN A SCANNING PROBE MICROSCOPY SYSTEM | Nov 03, 21 | Dec 07, 23 | Not available |
| 2023/0251,284 | AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING | Mar 21, 23 | Aug 10, 23 | Not available |
| 2023/0030,991 | METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE | Oct 23, 20 | Feb 02, 23 | Not available |
| 2023/0020,068 | METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT OF MULTIPLE PROBES IN ATOMIC FORCE MICROSCOPE | May 08, 21 | Jan 19, 23 | Not available |
| 2022/0373,575 | ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGNITION TECHNOLOGY AND OPERATION METHOD THEREOF | May 11, 21 | Nov 24, 22 | Not available |
| 2022/0357,359 | INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER | Mar 28, 22 | Nov 10, 22 | Not available |
| 2022/0260,611 | CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING SCANNING PROBE MICROSCOPE | Apr 30, 20 | Aug 18, 22 | HITACHI HIGH-TECH CORPORATION |
| 2022/0244,289 | AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING | Feb 02, 22 | Aug 04, 22 | Not available |
| 2022/0107,339 | Torsion Wing Probe Assembly | Sep 13, 21 | Apr 07, 22 | Not available |
| 2022/0057,429 | Atomic Force Microscope | Aug 18, 20 | Feb 24, 22 | Not available |