| 2025/0067,769 | SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF OPERATING SUCH A SYSTEM | Dec 23, 22 | Feb 27, 25 | Not available |
| 2025/0004,010 | ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME | Dec 23, 22 | Jan 02, 25 | Not available |
| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0402,215 | SCANNING PROBE MICROSCOPE AND PROGRAM | Mar 23, 22 | Dec 05, 24 | Not available |
| 2024/0264,199 | A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING ATTRACTIVE TIP-TO-SAMPLE INTERACTION | Jul 13, 21 | Aug 08, 24 | CESKE VYSOKE UCENI TECHNICKE V PRAZE |
| 2024/0230,709 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Mar 26, 24 | Jul 11, 24 | Not available |
| 2024/0210,443 | FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIP | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0210,444 | USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQUE IN A SALT FOG CORROSION TEST | Mar 12, 21 | Jun 27, 24 | Not available |
| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2023/0251,285 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Mar 30, 23 | Aug 10, 23 | Not available |
| 2022/0390,484 | SCANNING PROBE SYSTEM | Nov 30, 20 | Dec 08, 22 | Not available |
| 2022/0357,359 | INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER | Mar 28, 22 | Nov 10, 22 | Not available |
| 2022/0308,086 | Probe for Scanning Probe Microscope and Binary State Scanning Probe Microscope Including the Same | Mar 24, 22 | Sep 29, 22 | Not available |
| 2022/0082,582 | METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICROSCOPES USING OUT-OF-BANDWIDTH FREQUENCY COMPONENTS ADDED TO BIAS VOLTAGE AND RELATED SOFTWARE | Sep 30, 21 | Mar 17, 22 | Not available |
| 2022/0065,895 | Method and Apparatus for Aligning a Probe for Scanning Probe Microscopy to the Tip of a Pointed Sample | Sep 23, 19 | Mar 03, 22 | Not available |
| 2021/0311,090 | A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF | Aug 08, 19 | Oct 07, 21 | Not available |
| 2021/0190,818 | Measuring Device for a Scanning Probe Microscope and Method for Scanning Probe Microscopic Examination of a Measurement Sample with a Scanning Probe Microscope | Nov 19, 20 | Jun 24, 21 | Not available |
| 2021/0132,109 | METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICROSCOPES USING OUT-OF-BANDWIDTH FREQUENCY COMPONENTS ADDED TO BIAS VOLTAGE AND RELATED SOFTWARE | Nov 04, 20 | May 06, 21 | Not available |
| 2020/0400,715 | Measuring Device for a Scanning Probe Microscope and Method for Scanning Probe Microscopy of a Measurement Sample by Means of a Scanning Probe Microscope | Jun 17, 20 | Dec 24, 20 | Not available |
| 2020/0371,134 | AFM with Suppressed Parasitic Signals | Aug 12, 20 | Nov 26, 20 | Not available |