| 2025/0076,339 | SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON HIGH-SPEED INSTANTANEOUS FORCE CONTROL | Mar 09, 23 | Mar 06, 25 | Not available |
| 2025/0067,768 | ELEMENT OF AN AFM TOOL | Dec 22, 22 | Feb 27, 25 | ASML Netherlands B.V. |
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| 2024/0369,595 | LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE | Jun 10, 22 | Nov 07, 24 | Not available |
| 2024/0272,196 | SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA PIEZO-PROBES | Sep 22, 22 | Aug 15, 24 | Not available |
| 2024/0175,895 | Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA) | Feb 02, 24 | May 30, 24 | BRUKER NANO, INC. |
| 2024/0168,052 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Mar 26, 21 | May 23, 24 | Not available |
| 2024/0094,240 | OPTOMECHANICAL TRANSDUCER | Jan 21, 22 | Mar 21, 24 | Not available |
| 2024/0087,869 | SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANALYSIS USING SECONDARY ION MASS SPECTROMETRY | Sep 18, 23 | Mar 14, 24 | NOVA MEASURING INSTRUMENTS INC. |
| 2024/0069,095 | DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE MICROSCOPY | Aug 26, 22 | Feb 29, 24 | Not available |
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| 2022/0260,611 | CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING SCANNING PROBE MICROSCOPE | Apr 30, 20 | Aug 18, 22 | HITACHI HIGH-TECH CORPORATION |
| 2022/0252,638 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | Apr 18, 22 | Aug 11, 22 | BRUKER NANO, INC. |
| 2022/0244,288 | COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OPAQUE LIQUID ENVIRONMENTS, AND METHODS OF PERFORMING TOPOGRAPHY IMAGING | Jul 06, 20 | Aug 04, 22 | Not available |
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| 2021/0302,465 | SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCANNING PROBE MICROSCOPE | Dec 24, 20 | Sep 30, 21 | Not available |
| 2021/0096,152 | MICRO-OPTOMECHANICAL SYSTEM AND METHOD FOR THE PRODUCTION THEREOF | Dec 04, 18 | Apr 01, 21 | Karlsruher Institut für Technologie |
| 2020/0400,715 | Measuring Device for a Scanning Probe Microscope and Method for Scanning Probe Microscopy of a Measurement Sample by Means of a Scanning Probe Microscope | Jun 17, 20 | Dec 24, 20 | Not available |
| 2020/0319,229 | Surface Analyzer | Feb 11, 20 | Oct 08, 20 | Not available |