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2017/0269,123 | SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME | Aug 31, 16 | Sep 21, 17 | TOSHIBA MEMORY CORPORATION |
2017/0261,531 | STIMULATING AN OPTICAL SENSOR USING OPTICAL RADIATION PRESSURE | Aug 28, 15 | Sep 14, 17 | Not available |
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2016/0356,807 | Electrode Control Methodology for a Scanning Tunneling Microscope | Jun 06, 16 | Dec 08, 16 | Not available |
2016/0274,143 | Dual-Probe Scanning Probe Microscope | Mar 22, 16 | Sep 22, 16 | BRUKER NANO, INC. |
2016/0266,165 | DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES | May 20, 16 | Sep 15, 16 | RAVE LLC |
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2016/0003,866 | Microscope Having A Multimode Local Probe, Tip-Enhanced Raman Microscope, And Method For Controlling The Distance Between The Local Probe And The Sample | Jan 13, 14 | Jan 07, 16 | CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE POLYTECHNIQUE, |
2015/0377,920 | Variable Density Scanning | Jun 30, 15 | Dec 31, 15 | Not available |
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