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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2025/0110,152 METHOD FOR CHARACTERIZING INTERACTION FORCE BETWEEN LIGNIN AND CELLULASEAug 31, 23Apr 03, 25Nanjing Forestry University
2025/0076,339 SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON HIGH-SPEED INSTANTANEOUS FORCE CONTROLMar 09, 23Mar 06, 25Not available
2025/0067,768 ELEMENT OF AN AFM TOOLDec 22, 22Feb 27, 25ASML Netherlands B.V.
2025/0067,769 SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF OPERATING SUCH A SYSTEMDec 23, 22Feb 27, 25Not available
2025/0067,770 METHOD AND APPARATUS FOR SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM)Dec 19, 22Feb 27, 25Not available
2025/0067,771 Method For Producing A Substrate Comprising Scanning Probe Microscopy TipsAug 13, 24Feb 27, 25Not available
2025/0069,843 Detection of Probabilistic Process WindowsNov 11, 24Feb 27, 25Fractilia, LLC
2025/0052,781 Atomic Force Microscopy Probe with Tilted Tip and Method of Fabrication ThereofAug 12, 24Feb 13, 25Not available
2025/0057,025 DISPLAY DEVICE AND METHOD FOR INSPECTING THE DISPLAY DEVICEMar 14, 24Feb 13, 25Not available
2025/0017,683 SYSTEMS AND METHODS FOR OPTOGENETIC IMAGINGOct 01, 24Jan 16, 25Inscopix, Inc.
2025/0012,778 METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSISJul 17, 24Jan 09, 25Not available
2025/0004,010 ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAMEDec 23, 22Jan 02, 25Not available
2024/0426,869 METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBEOct 07, 22Dec 26, 24Not available
2024/0426,870 SCANNING PROBE MICROSCOPEMar 16, 22Dec 26, 24Not available
2024/0418,746 SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAMMar 24, 22Dec 19, 24Not available
2024/0410,916 FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DISULFIDENov 21, 19Dec 12, 24Not available
2024/0410,962 METROLOGY DEVICE AND METHODOct 07, 22Dec 12, 24Not available
2024/0402,215 SCANNING PROBE MICROSCOPE AND PROGRAMMar 23, 22Dec 05, 24Not available
2024/0402,216 RUGGED, SINGLE CRYSTAL WIDE-BAND-GAP-MATERIAL SCANNING-TUNNELING-MICROSCOPY/LITHOGRAPHY TIPSAug 15, 24Dec 05, 24Not available
2024/0393,363 ACTIVE DITHER BALANCING OF A MOTION STAGE FOR SCANNING PROBE MICROSCOPYSep 30, 22Nov 28, 24Not available

Showing 1 to 20 of 1327 results