| 2025/0093,240 | METHOD OF IDENTIFYING DEFECTS IN CRYSTALS | Jul 18, 24 | Mar 20, 25 | GLOBALWAFERS CO., LTD. |
| 2025/0003,841 | Ion Milling Device | Oct 01, 21 | Jan 02, 25 | Not available |
| 2024/0404,786 | METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INVESTIGATION DEVICE TO PERFORM SUCH METHOD | Aug 06, 24 | Dec 05, 24 | Not available |
| 2024/0255,438 | METHODS FOR DETECTING DEFECTS IN A SINGLE CRYSTAL SILICON STRUCTURE | Jan 29, 24 | Aug 01, 24 | Not available |
| 2024/0249,910 | SUPPORT STRUCTURE OF INVERTED LAMELLA FOR TALL ROI | Jan 19, 24 | Jul 25, 24 | Not available |
| 2024/0183,774 | METHOD FOR SCREENING THE OPTIMAL ZINC ION CONCENTRATION OF A PRIMARY LOOP DURING A THERMAL STATE FUNCTION TEST OF A NUCLEAR POWER PLANT | Nov 15, 23 | Jun 06, 24 | Not available |
| 2024/0183,805 | QUALITY CONTROL EVALUATION METHOD OF CYANATE ESTER MATRIX RESIN MATERIAL WITHIN CFRP COMPOSITE CONCERNING LOCALIZED HYDROLYTIC DEGRADATION | Dec 05, 22 | Jun 06, 24 | The Aerospace Corporation |
| 2024/0085,282 | APPARATUS FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES AND METHOD FOR MANUFACTURING ANALYTICAL SEMICONDUCTOR SAMPLES BY USING THE SAME | Aug 23, 23 | Mar 14, 24 | Samsung Electronics Co., Ltd. |
| 2023/0375,445 | BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTIPLE SAMPLES | May 19, 22 | Nov 23, 23 | FEI Company |
| 2023/0067,374 | ANALYSIS DEVICE, ANALYSIS METHOD, AND STORAGE MEDIUM | Aug 25, 22 | Mar 02, 23 | Not available |
| 2022/0381,761 | METHOD FOR DETERMINING TRACE METALS IN SILICON | Jul 21, 20 | Dec 01, 22 | Wacker Chemie AG |
| 2022/0236,195 | METHOD FOR DETECTING COVERAGE RATE OF INTERMETALLIC COMPOUND | Dec 06, 19 | Jul 28, 22 | Not available |
| 2021/0080,361 | METHOD OF IN-SITU TEM NANOINDENTATION FOR DAMAGED LAYER OF SILICON | Mar 13, 19 | Mar 18, 21 | Not available |
| 2020/0300,736 | THIN-SAMPLE-PIECE FABRICATING DEVICE AND THIN-SAMPLE-PIECE FABRICATING METHOD | Feb 28, 19 | Sep 24, 20 | Not available |
| 2020/0188,967 | METHOD OF, AND AN APPARATUS FOR, RINSING MATERIALOGRAPHIC SAMPLES | Feb 24, 20 | Jun 18, 20 | Not available |
| 2020/0182,752 | METHOD OF ACQUIRING SAMPLE FOR EVALUATION OF SiC SINGLE CRYSTAL | Dec 03, 19 | Jun 11, 20 | EC-Showa Denko K.K. |
| 2020/0141,843 | APPARATUS FOR ELECTROLYTIC ETCHING AND DISSOLUTION AND METHOD FOR EXTRACTING METAL COMPOUND PARTICLES | Feb 17, 17 | May 07, 20 | Nippon Steel & Sumitomo Metal Corporation |
| 2020/0126,756 | FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION | Dec 18, 19 | Apr 23, 20 | FEI Company |
| 2019/0353,566 | METHODS FOR ACQUIRING PLANAR VIEW STEM IMAGES OF DEVICE STRUCTURES | Jul 30, 19 | Nov 21, 19 | Not available |
| 2019/0204,199 | FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION CHARACTERIZATION METHOD OF PRECIPITATE PARTICLES IN METAL MATERIAL | Dec 26, 18 | Jul 04, 19 | Not available |