G03F 1/20

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Showing 1 to 20 of 89 results

Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9989860 Method of generating a pattern on a photomask using a plurality of beams and pattern generator for performing the sameSep 02, 16Jun 05, 18Samsung Electronics Co., Ltd.
9964846 Two-dimensional heterostructure materialsJul 20, 16May 08, 18UT - Battelle LLC
9931666 Mask assembly having frame with support stickJan 28, 14Apr 03, 18Samsung Display Co., Ltd
9927698 Dual exposure patterning of a photomask to print a contact, a via or curvilinear shape on an integrated circuitAug 11, 16Mar 27, 18Globalfoundries Inc.
9897908 Ebeam three beam aperture arrayDec 19, 14Feb 20, 18INTEL CORPORATION
9880459 Photomask blank and method for preparing photomaskJul 11, 16Jan 30, 18SHIN-ETSU CHEMICAL CO., LTD.
9864266 Photomask blankAug 17, 16Jan 09, 18SHIN-ETSU CHEMICAL CO., LTD.
9864269 Photomask blankAug 17, 16Jan 09, 18SHIN-ETSU CHEMICAL CO., LTD.
9852884 Information processing apparatus, information processing method, and storage mediumFeb 06, 15Dec 26, 17NIPPON CONTROL SYSTEM CORPORATION
9824855 Information processing apparatus, information processing method, and storage mediumFeb 06, 15Nov 21, 17NIPPON CONTROL SYSTEM CORPORATION
9740098 Chemically amplified negative resist composition using novel onium salt and resist pattern forming processApr 08, 16Aug 22, 17SHIN-ETSU CHEMICAL CO., LTD.
9715169 Method and system for forming a pattern on a reticle using charged particle beam lithographyMay 17, 16Jul 25, 17D2S, Inc.
9625809 Method and system for forming patterns using charged particle beam lithography with variable pattern dosageJun 16, 16Apr 18, 17D2S, Inc.
9625813 Chemical amplification resist composition, resist film using the composition, resist-coated mask blanks, resist pattern forming method, photomask and polymer compoundJul 16, 13Apr 18, 17FUJIFILM CORPORATION
9541900 Method for producing a beam shaping holographic optical elementDec 26, 13Jan 10, 17COVESTRO DEUTSCHLAND AG, LG DISPLAY CO., LTD.,
9535316 Photomask with three states for forming multiple layer patterns with a single exposureSep 18, 13Jan 03, 17TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
9530610 Blanking aperture array device for multi-beams, and fabrication method of blanking aperture array device for multi-beamsNov 30, 15Dec 27, 16NTT ADVANCED TECHNOLOGY CORPORATION, NUFLARE TECHNOLOGY, INC.,
9465297 Method and system for forming patterns with charged particle beam lithographyMay 18, 15Oct 11, 16D2S, Inc.
9429835 Structure and method of photomask with reduction of electron-beam scatterringFeb 12, 14Aug 30, 16TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
9411225 Photo acid generator, chemically amplified resist composition, and patterning processJun 02, 15Aug 09, 16SHIN-ETSU CHEMICAL CO., LTD.

Showing 1 to 20 of 89 results