G01R 1/067

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Showing 1 to 20 of 654 results

Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9995769 Universal watthour meter socket/adapter for field testingMar 15, 13Jun 12, 18Radian Research Inc.
9995786 Apparatus and method for evaluating semiconductor deviceJul 07, 16Jun 12, 18Mitsubishi Electric Corporation
9995767 Universal container for device under testOct 15, 14Jun 12, 18Advantest Corporation
9989572 Method and apparatus for testing interposer dies prior to assemblySep 23, 14Jun 05, 18Xilinx Inc.
9989558 Probe head assemblies, components thereof, test systems including the same, and methods of operating the sameDec 17, 15Jun 05, 18Cascade Microtech, Inc.
9983230 Probe pin and manufacturing method thereofFeb 23, 16May 29, 18Not available
9983228 Triaxial DC-AC connection systemSep 04, 15May 29, 18KEITHLEY INSTRUMENTS, LLC
9977054 Etching for probe wire tips for microelectronic device testJun 15, 15May 22, 18Intel Corp.
9977053 Wafer probe alignmentJun 08, 16May 22, 18IBM Corporation
9970960 Sliding rail type probeFeb 23, 17May 15, 18CHUNGHWA PRECISION TEST TECH. CO., LTD.
9972933 Contact probeAug 11, 17May 15, 18Japan Electronic Materials Corporation
9970959 Coated probe and method of fabricating the sameSep 24, 14May 15, 18(6) INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
9967982 Method of producing an interposer with microspring contactsApr 19, 13May 08, 18Palo Alto Research Center Incorporated
9958477 Testing machine and operation method thereofMar 09, 16May 01, 18MPI Corporation
9958497 Testing pluggable moduleAug 31, 16May 01, 18TE Connectivity Corporation
9952167 Method and device to aid in the inspection and certification of harvested food for human consumptionOct 10, 14Apr 24, 18Seafood Analytics
9936918 Insulation of micro structuresNov 29, 12Apr 10, 18SILEX MICROSYSTEMS AB
9939462 Probe for measuring biomolecules by means of electrochemical impedance spectroscopyMay 15, 14Apr 10, 18Kimal plc
9933457 Device for testing electronic componentsMar 10, 15Apr 03, 18Multitest elektronische Systeme GmbH
9933479 Multi-die interface for semiconductor testing and method of manufacturing sameNov 11, 15Apr 03, 18Spire Manufacturing, Inc.

Showing 1 to 20 of 654 results