| RE49785 | Connector apparatus for a field device as well as field device with such a connector apparatus | May 26, 21 | Jan 02, 24 | Endress+Hauser Flowtec AG |
| 9995787 | Apparatus and method for manufacturing substrates | Feb 04, 16 | Jun 12, 18 | Samsung Electronics Co., Ltd.; Semes Co. Ltd.; |
| 9995769 | Universal watthour meter socket/adapter for field testing | Mar 15, 13 | Jun 12, 18 | Radian Research Inc. |
| 9995770 | Multidirectional semiconductor arrangement testing | Mar 21, 14 | Jun 12, 18 | Taiwan Semiconductor Manufacturing Company Limited |
| 9995786 | Apparatus and method for evaluating semiconductor device | Jul 07, 16 | Jun 12, 18 | Mitsubishi Electric Corporation |
| 9995767 | Universal container for device under test | Oct 15, 14 | Jun 12, 18 | Advantest Corporation |
| 9995768 | Interconnection meter socket adapters | Aug 28, 14 | Jun 12, 18 | San Diego Gas & Electric Company |
| 9989557 | System and method for analyzing electronic devices having opposing thermal components | Feb 17, 15 | Jun 05, 18 | Exatron Inc. |
| 9983229 | Test socket for testing semiconductor chip package and method of manufacturing the same | Jun 18, 15 | May 29, 18 | Samsung Electronics Co., Ltd. |
| 9983232 | Prober for testing devices in a repeat structure on a substrate | Sep 19, 14 | May 29, 18 | Cascade Microtech, Inc. |
| 9983228 | Triaxial DC-AC connection system | Sep 04, 15 | May 29, 18 | KEITHLEY INSTRUMENTS, LLC |
| 9977052 | Test fixture | Oct 04, 16 | May 22, 18 | Teradyne, Inc. |
| 9977051 | Electrical conductor testing device | Jan 13, 15 | May 22, 18 | Fluke Corporation |
| 9978296 | Method and device for detecting defect of display panel | Jun 19, 15 | May 22, 18 | BOE Technology Group Co. Ltd.; BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.; |
| 9972926 | Electric component socket | Dec 01, 15 | May 15, 18 | Enplas Corporation |
| 9964565 | Detector for overhead network and overhead network comprising such a detector | Sep 15, 15 | May 08, 18 | Schneider Electric Industries SAS |
| 9958499 | Constant stress pin tip for testing integrated circuit chips | Jul 06, 16 | May 01, 18 | JohnsTech International Corporation |
| 9958500 | Vacuum socket and semiconductor testing system including the same | Jun 20, 16 | May 01, 18 | Samsung Electronics Co., Ltd. |
| 9958475 | Test device and test method using the same | Feb 25, 16 | May 01, 18 | BOE TECHNOLOGY GROUP CO., LTD; BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.; |
| 9958476 | Floating nest for a test socket | Nov 22, 16 | May 01, 18 | FormFactor, Inc. |