G01Q 40/02

Technology



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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9797924 Calibration standard with pre-determined featuresApr 17, 13Oct 24, 17SEAGATE TECHNOLOGY LLC
9200883 Transferable probe tipsMay 05, 11Dec 01, 15INTERNATIONAL BUSINESS MACHINES CORPORATION
8739310 Characterization structure for an atomic force microscope tipApr 24, 13May 27, 14COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, NANOTOOLS GMBH,
8443460 Method and structure for characterising an atomic force microscopy tipOct 18, 10May 14, 13COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, Commissariat à l′ énergie atomique et aux énergies alternatives,
8109135 Cantilever assemblyNov 04, 04Feb 07, 12NANO WORLD AG