| 9823271 | Semiconductor testing structures and semiconductor testing apparatus | Sep 29, 16 | Nov 21, 17 | SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION, SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION, |
| 9797923 | Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses | Feb 20, 15 | Oct 24, 17 | FEI COMPANY |
| 9784760 | Probe and sample exchange mechanism | Aug 06, 14 | Oct 10, 17 | INFINITESIMA LIMITED |
| 9746493 | Sample holder for an atomic force microscope | Jul 05, 14 | Aug 29, 17 | UNIVERSITY OF BASEL |
| 9746494 | Specimen support and scanning probe microscope | Feb 19, 15 | Aug 29, 17 | THE FOUNDATION FOR THE PROMOTION OF INDUSTRIAL SCIENCE |
| 9719916 | PeakForce photothermal-based detection of IR nanoabsorption | Sep 02, 16 | Aug 01, 17 | BRUKER NANO, INC. |
| 9689893 | Scanning probe microscope | May 31, 16 | Jun 27, 17 | HITACHI HIGH-TECH SCIENCE CORPORATION |
| 9581616 | Modular atomic force microscope with environmental controls | Aug 04, 15 | Feb 28, 17 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
| 9557348 | Semiconductor testing structures and fabrication method thereof | Dec 11, 14 | Jan 31, 17 | SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION, SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION, |
| 9470712 | Apparatus and method for atomic force probing/SEM nano-probing/scanning probe microscopy and collimated ion milling | Oct 09, 15 | Oct 18, 16 | GLOBALFOUNDRIES INC. |
| 9279828 | Sample fixing member for atomic force microscope | Jan 29, 13 | Mar 08, 16 | NITTO DENKO CORPORATION |
| 9279849 | Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices | Aug 18, 15 | Mar 08, 16 | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 9207167 | Peak force photothermal-based detection of IR nanoabsorption | Feb 10, 15 | Dec 08, 15 | BRUKER NANO, INC. |
| 9201112 | Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices | Dec 09, 13 | Dec 01, 15 | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 9075081 | Method and means for coupling high-frequency energy to and/or from the nanoscale junction of an electrically-conductive tip with a semiconductor | Mar 24, 14 | Jul 07, 15 | Not available |
| 8955161 | Peakforce photothermal-based detection of IR nanoabsorption | Mar 17, 14 | Feb 10, 15 | BRUKER NANO, INC. |
| 8935811 | Vertically mounted sample stage for microscopy and scanning probe microscope using the sample stage | Dec 20, 13 | Jan 13, 15 | SAMSUNG ELECTRONICS CO., LTD. |
| 8925111 | Scanning probe microscope and method of operating the same | Dec 24, 13 | Dec 30, 14 | SAMSUNG ELECTRONICS CO., LTD. |
| 8878147 | Method and apparatus for in situ preparation of serial planar surfaces for microscopy | Jan 18, 13 | Nov 04, 14 | Not available |
| 8646344 | Mounting systems for a surface forces apparatus | Nov 20, 12 | Feb 11, 14 | Not available |