G01Q 30/14

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9746494 Specimen support and scanning probe microscopeFeb 19, 15Aug 29, 17THE FOUNDATION FOR THE PROMOTION OF INDUSTRIAL SCIENCE
9678105 Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoringJan 03, 14Jun 13, 17THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
9482690 Scanning probe microscopeJan 22, 15Nov 01, 16OLYMPUS CORPORATION
9423416 Scanning probe microscope and measuring method using sameAug 28, 12Aug 23, 16HITACHI, LTD.
9417262 Scanning probe microscope and sample observation method using sameOct 28, 13Aug 16, 16HITACHI, LTD.
9252004 Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging systemJul 30, 14Feb 02, 16CANON KABUSHIKI KAISHA
9229028 Sensor for low force-noise detection in liquidsAug 21, 12Jan 05, 16THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
9140720 Feedback controller in probe microscope utilizing a switch and a inverterJul 05, 13Sep 22, 15BOISE STATE UNIVERSITY
9110093 Sealed AFM cellNov 15, 12Aug 18, 15NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
9091705 System and method for high-speed atomic force microscopy with switching between two feedback loopsMay 01, 13Jul 28, 15BOISE STATE UNIVERSITY
9075082 Fluid delivery for scanning probe microscopyMay 29, 13Jul 07, 15Not available
9064680 AFM fluid delivery/liquid extraction surface sampling/electrostatic spray cantilever probeApr 30, 14Jun 23, 15UT-BATTELLE, LLC
8986626 Probe arrangement for exchanging in a controllable way liquids with micro-sized samples of material like biological cellsJul 24, 09Mar 24, 15ETH Zürich / ETH Transfer, ETH Zürich / ETH Transfer,
8973161 Method and apparatus for nanomechanical measurement using an atomic force microscopeJun 24, 13Mar 03, 15RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
8549660 Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquidApr 09, 10Oct 01, 13BOISE STATE UNIVERSITY
8505109 Measuring probe device for a probe microscope, measuring cell and scanning probe microscopeJul 24, 08Aug 06, 13JPK Instruments AG