G01Q 30/12

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9689893 Scanning probe microscopeMay 31, 16Jun 27, 17HITACHI HIGH-TECH SCIENCE CORPORATION
9658246 Method of studying a sample in an ETEMAug 03, 12May 23, 17FEI COMPANY
9581616 Modular atomic force microscope with environmental controlsAug 04, 15Feb 28, 17OXFORD INSTRUMENTS ASYLUM RESEARCH, INC
9442132 Atomic force microscope drying system and atomic force microscopeFeb 19, 15Sep 13, 16NATIONAL TSING HUA UNIVERSITY
9252004 Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging systemJul 30, 14Feb 02, 16CANON KABUSHIKI KAISHA
9110093 Sealed AFM cellNov 15, 12Aug 18, 15NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
9075082 Fluid delivery for scanning probe microscopyMay 29, 13Jul 07, 15Not available
9052338 Inert gas delivery system for electrical inspection apparatusNov 18, 13Jun 09, 15INTERNATIONAL BUSINESS MACHINES CORPORATION
8973161 Method and apparatus for nanomechanical measurement using an atomic force microscopeJun 24, 13Mar 03, 15RUTGERS, THE STATE UNIVERSITY OF NEW JERSEY
8893309 Scanning tunneling microscope assembly, reactor, and systemJun 22, 10Nov 18, 14THE REGENTS OF THE UNIVERSITY OF CALIFORNIA