G01Q 30/04

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Showing 1 to 20 of 42 results

Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9995766 Methods and systems for measuring a property of a macromoleculeJun 16, 10Jun 12, 18The Regents of the University of California
9990737 Apparatus and method for correlating images of a photolithographic maskDec 12, 14Jun 05, 18Carl Zeiss SMT GmbH
9984941 Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layersMay 31, 16May 29, 18International Business Machine Corporation
9933453 Chemical nano-identification of a sample using normalized near-field spectroscopyOct 24, 17Apr 03, 18Bruker Nano, Inc.
9891280 Probe-based data collection system with adaptive mode of probing controlled by local sample propertiesDec 02, 16Feb 13, 18FEI EFA, INC.
9880194 Actuator module for actuating a loadMar 31, 15Jan 30, 18NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
9846178 Chemical nano-identification of a sample using normalized near-field spectroscopyAug 18, 16Dec 19, 17BRUKER NANO, INC.
9823269 Surface analyzerSep 12, 11Nov 21, 17SHIMADZU CORPORATION
9689890 Fully digitally controller for cantilever-based instrumentsJan 06, 15Jun 27, 17OXFORD INSTRUMENTS AFM INC, OXFORD INSTRUMENTS PLC,
9612257 Full information acquisition in scanning probe microscopy and spectroscopyMar 07, 16Apr 04, 17UT-BATTELLE, LLC
9586817 Semi-auto scanning probe microscopy scanningJul 26, 12Mar 07, 17SEAGATE TECHNOLOGY LLC
9575307 Non-vector space sensing and control systems and methods for video rate imaging and manipulationMar 15, 13Feb 21, 17BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY
9562927 Force detection for microscopy based on direct tip trajectory observationOct 01, 15Feb 07, 17THE CURATORS OF THE UNIVERSITY OF MISSOURI
9541575 Exploitation of second-order effects in atomic force microscopyNov 26, 14Jan 10, 17TUFTS UNIVERSITY
9535087 Band excitation method applicable to scanning probe microscopyJun 26, 15Jan 03, 17UT-BATTELLE, LLC
9459278 Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) imagesJul 06, 15Oct 04, 16KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
9448393 Method and apparatus for automated scanning probe microscopyFeb 24, 15Sep 20, 16NUOMEDIS AG
9397587 Multi-actuator design and control for a high-speed/large-range nanopositioning systemNov 19, 14Jul 19, 16MASSACHUSETTS INSTITUTE OF TECHNOLOGY
9383387 System for lightweight image processingJun 26, 15Jul 05, 16THE JOHNS HOPKINS UNIVERSITY
9335342 Scanning tunneling microscope and method of displaying observation imageOct 03, 13May 10, 16JAPAN SCIENCE AND TECHNOLOGY AGENCY

Showing 1 to 20 of 42 results