| 9995765 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Mar 22, 16 | Jun 12, 18 | Bruker Nano, Inc. |
| 9535086 | Interface of a microfabricated scanning force sensor for combined force and position sensing | Jun 17, 15 | Jan 03, 17 | Femtotools AG |
| 9410984 | Surface force measuring method and surface force measuring apparatus | Jan 16, 14 | Aug 09, 16 | ELIONIX INC. |
| 9366694 | Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample | Jan 13, 14 | Jun 14, 16 | CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE POLYTECHNIQUE, |
| 9267962 | Scanning probe microscope comprising an isothermal actuator | Aug 11, 14 | Feb 23, 16 | ICSPI CORP. |
| 9229028 | Sensor for low force-noise detection in liquids | Aug 21, 12 | Jan 05, 16 | THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
| 9091704 | Method for controlling a scanning microscope | Oct 10, 12 | Jul 28, 15 | UNIVERSIDAD AUTONOMA DE MADRID |
| 8959661 | Atomic force microscope probe, method for preparing same, and uses thereof | Dec 20, 11 | Feb 17, 15 | COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES |
| 8925111 | Scanning probe microscope and method of operating the same | Dec 24, 13 | Dec 30, 14 | SAMSUNG ELECTRONICS CO., LTD. |
| 8893311 | Three-dimensional imaging and manipulation | Jan 07, 09 | Nov 18, 14 | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 8875311 | Scanning probe microscopy cantilever comprising an electromagnetic sensor | Aug 09, 12 | Oct 28, 14 | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 8857248 | Piezoelectric microcantilevers and uses in atomic force microscopy | Jun 14, 11 | Oct 14, 14 | DREXEL UNIVERSITY |
| 8810110 | Micro-mechanical component with cantilever integrated electrical functional element | Mar 13, 12 | Aug 19, 14 | NANOWORLD AG |
| 8689359 | Apparatus and method for investigating surface properties of different materials | Jun 26, 08 | Apr 01, 14 | Nano Analytik GmbH |
| 7891016 | Automatic landing method and apparatus for scanning probe microscope using the same | May 29, 08 | Feb 15, 11 | IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
| 7874016 | Scanning probe microscope and scanning method | Dec 20, 07 | Jan 18, 11 | HITACHI HIGH-TECH SCIENCE CORPORATION |
| 7854016 | Process for manufacturing probes intended to interact with a storage medium and probe obtained thereby | Dec 18, 07 | Dec 14, 10 | STMICROELECTRONICS S.R.L. |
| 7797757 | Cantilevers with integrated actuators for probe microscopy | Aug 14, 07 | Sep 14, 10 | GEORGIA TECH RESEARCH CORPORATION |