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| 9989556 | Systems and devices for non-destructive surface chemical analysis of samples | Feb 09, 17 | Jun 05, 18 | Horiba Instruments Incorporated |
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| 9766266 | Method of advancing a probe tip of a scanning microscopy device towards a sample surface, and device therefore | Apr 28, 15 | Sep 19, 17 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
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| 9645182 | Method and apparatus for detecting an energized E-field | Oct 16, 13 | May 09, 17 | WHIRLPOOL CORPORATION |
| 9625491 | Scanning mechanism and scanning probe microscope | Feb 05, 15 | Apr 18, 17 | OLYMPUS CORPORATION |
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| 9581616 | Modular atomic force microscope with environmental controls | Aug 04, 15 | Feb 28, 17 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
| 9568495 | Systems and methods for non-destructive surface chemical analysis of samples | May 20, 15 | Feb 14, 17 | HORIBA INSTRUMENTS INCORPORATED |
| 9568496 | Scanning probe sensor with a ferromagnetic fluid | Nov 17, 15 | Feb 14, 17 | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 9535085 | Intermittent contact resonance atomic force microscope and process for intermittent contact resonance atomic force microscopy | Aug 03, 15 | Jan 03, 17 | UNIVERSITY OF MARYLAND, BALTIMORE, THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE, |
| 9519005 | Scanning mechanism and scanning probe microscope | Sep 23, 15 | Dec 13, 16 | OLYMPUS CORPORATION |
| 9506947 | System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing | Nov 24, 14 | Nov 29, 16 | DCG SYSTEMS, INC. |
| 9500670 | Method and device for controlling a scanning probe microscope | Dec 12, 13 | Nov 22, 16 | UNIVERSITY OF BASEL |