G01Q 30/16

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
2023/0176,088 DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEADMay 06, 21Jun 08, 23Not available
2016/0356,810 SCANNING PROBE MICROSCOPEMay 31, 16Dec 08, 16HITACHI HIGH-TECH SCIENCE CORPORATION
2015/0226,766 APPARATUS AND METHOD FOR ATOMIC FORCE MICROSCOPYJul 05, 13Aug 13, 15BRUKER NANO, INC., IMEC,