Class G11C : STATIC STORES
Subclass 7/04: Arrangements for writing information into, or reading information out from, a digital store (G11C 5/00 takes precedence; auxiliary circuits for stores using semiconductor devices G11C 11/4063, G11C 11/413, G11C 11/4193) with means for avoiding disturbances due to temperature effects
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12266419 | Semiconductor device | Sep 14, 22 | Apr 01, 25 | Samsung Electronics Co. Ltd. |
| 12266420 | Temperature-compensated time estimate for a block to reach a uniform charge loss state | Nov 14, 23 | Apr 01, 25 | Micron Technology Inc. |
| 12228961 | Memory system using asymmetric source-synchronous clocking | Apr 08, 24 | Feb 18, 25 | RAMBUS INC. |
| 12216537 | Error detection, prediction and handling techniques for system-in-package memory architectures | Nov 04, 20 | Feb 04, 25 | ALIBABA GROUP HOLDING LIMITED |
| 12210401 | Temperature based optimization of data storage operations | Sep 05, 19 | Jan 28, 25 | Micron Technology Inc. |
| 12211554 | Memory device and program operation thereof | Oct 17, 22 | Jan 28, 25 | Yangtze Memory Technologies Co., Ltd. |
| 12198781 | Storage device with eye open monitoring (EOM) circuit and method to control | Jul 18, 22 | Jan 14, 25 | SAMSUNG ELECTRONICS CO. LTD. |
| 12183416 | Apparatuses including temperature-based threshold voltage compensated sense amplifiers and methods for compensating same | May 10, 22 | Dec 31, 24 | Not available |
| 12184280 | Apparatuses and methods for identifying memory devices of a semiconductor device sharing an external resistance | Jun 27, 23 | Dec 31, 24 | Not available |
| 12175081 | Dynamic processing of storage command based on internal operations of storage system | Jun 28, 23 | Dec 24, 24 | Kioxia Corporation |
| 12164783 | Cross-temperature compensation based on media endurance in memory devices | Aug 29, 22 | Dec 10, 24 | Micron Technology Inc. |
| 12165740 | Memory traffic monitoring | Aug 22, 22 | Dec 10, 24 | Micron Technology Inc. |
| 12148483 | Multi-sampled, charge-sharing thermometer in memory device | Dec 14, 23 | Nov 19, 24 | Micron Technology Inc. |
| 12148503 | Integrated circuit comprising a non-volatile memory | Sep 16, 22 | Nov 19, 24 | STMicroelectronics (Grand Ouest) SAS |
| 12141443 | Dynamic temperature compensation in a memory component | May 10, 22 | Nov 12, 24 | Not available |
| 12136467 | Tracking the effects of voltage and temperature on a memory device using an internal oscillator | Jun 02, 22 | Nov 05, 24 | Micron Technology Inc. |
| 12131785 | Weak erase pulse | Jun 01, 22 | Oct 29, 24 | Intel NDTM US LLC |
| 12131795 | Adaptive temperature compensation for a memory device | Jul 01, 22 | Oct 29, 24 | Micron Technology Inc. |
| 12119042 | Low-power source-synchronous signaling | Jul 17, 23 | Oct 15, 24 | RAMBUS INC. |
| 12111214 | Semiconductor device | Nov 11, 20 | Oct 08, 24 | CHANGXIN MEMORY TECHNOLOGIES, INC. |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0118,371 | STORAGE DEVICE FOR SELECTIVELY PERFORMING HIGH-RELIABILITY PROGRAM OPERATION ACCORDING TO TEMPERATURE, AND OPERATION METHOD OF THE STORAGE DEVICE | May 17, 24 | Apr 10, 25 | Not available |
| 2025/0118,379 | NON-VOLATILE MEMORY WITH CURRENT DETECTION CIRCUIT | Oct 05, 23 | Apr 10, 25 | Western Digital Technologies, Inc. |
| 2025/0095,696 | MEMORY DEVICE GENERATING VOLTAGE RESPONSIVE TO TEMPERATURE AND METHOD OF OPERATING THE SAME | Mar 25, 24 | Mar 20, 25 | SK HYNIX INC. |
| 2025/0069,644 | LOW-POWER SOURCE-SYNCHRONOUS SIGNALING | Sep 11, 24 | Feb 27, 25 | Not available |
| 2025/0069,679 | VOLTAGE SCALING BASED ON ERROR RATE FLUCTUATIONS | Jul 16, 24 | Feb 27, 25 | Not available |
| 2025/0070,782 | APPARATUSES AND METHODS FOR IDENTIFYING MEMORY DEVICES OF A SEMICONDUCTOR DEVICE SHARING AN EXTERNAL RESISTANCE | Nov 14, 24 | Feb 27, 25 | Not available |
| 2025/0053,317 | CROSS-TEMPERATURE COMPENSATION BASED ON MEDIA ENDURANCE IN MEMORY DEVICES | Oct 28, 24 | Feb 13, 25 | Not available |
| 2025/0053,524 | Clock Generation for Timing Communications with Ranks of Memory Devices | Aug 16, 24 | Feb 13, 25 | Not available |
| 2025/0054,561 | TIMING-DRIFT CALIBRATION | Aug 19, 24 | Feb 13, 25 | Not available |
| 2025/0044,948 | DYNAMIC TEMPERATURE COMPENSATION IN A MEMORY COMPONENT | Oct 18, 24 | Feb 06, 25 | Not available |
| 2025/0046,348 | TRACKING THE EFFECTS OF VOLTAGE AND TEMPERATURE ON A MEMORY DEVICE USING AN INTERNAL OSCILLATOR | Oct 23, 24 | Feb 06, 25 | Not available |
| 2025/0029,639 | ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE | Oct 03, 24 | Jan 23, 25 | Not available |
| 2025/0022,524 | MEMORY DEVICE AND METHOD FOR CALIBRATING IMPEDANCE THEREOF | Jan 31, 24 | Jan 16, 25 | Not available |
| 2024/0420,775 | OPEN BLOCK DETECTION METHOD USING FOR FIRST AND SECOND TIME PERIOD READ TIME VALLEY FOR NON-VOLATILE MEMORY APPARATUS | Aug 04, 23 | Dec 19, 24 | Western Digital Technologies, Inc. |
| 2024/0420,780 | MEMORY DEVICE FOR PERFORMING CHANNEL PRECHARGE OPERATION AND METHOD FOR OPERATING THE SAME | Oct 26, 23 | Dec 19, 24 | Not available |
| 2024/0402,788 | MEMORY CONTROLLER WITH TRANSACTION-QUEUE-DEPENDENT POWER MODES | Feb 29, 24 | Dec 05, 24 | Not available |
| 2024/0402,920 | MEMORY MODULE CAPABLE OF REDUCING POWER CONSUMPTION AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME | Aug 14, 24 | Dec 05, 24 | SK HYNIX INC. |
| 2024/0402,935 | TEMPERATURE-BASED MEMORY MANAGEMENT | Jun 04, 24 | Dec 05, 24 | Not available |
| 2024/0395,327 | SOLID-STATE DRIVE WITH THERMAL ANNEAL FUNCTION | Apr 25, 24 | Nov 28, 24 | Not available |
| 2024/0395,825 | LOGIC CIRCUIT, PROCESSING UNIT, ELECTRONIC COMPONENT, AND ELECTRONIC DEVICE | Jul 31, 24 | Nov 28, 24 | Not available |
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