G03F 1/52

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Description

Class  G03F : PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR


Subclass 1/52: Originals for photomechanical production of textured or patterned surfaces, e.g. masks, photo-masks or reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof Reflectors

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12216398 Reflective mask blank and reflective maskJan 19, 24Feb 04, 25AGC INC.
12209046 Glass substrate for EUVL, manufacturing method thereof, mask blank for EUVL, and manufacturing method thereofApr 30, 21Jan 28, 25AGC Inc.
12130548 Extreme ultraviolet mask with reduced wafer neighboring effectJun 28, 23Oct 29, 24TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
12066757 Mask and method of forming the sameApr 27, 23Aug 20, 24Taiwan Semiconductor Manufacturing Company Ltd.
12001132 Protection layer on low thermal expansion material (LTEM) substrate of extreme ultraviolet (EUV) maskAug 07, 19Jun 04, 24TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
12001133 Reflective mask blank, reflective mask, method of manufacturing reflective mask blank, and method of manufacturing reflective maskOct 20, 23Jun 04, 24AGC Inc.
12001134 Reflective mask blank, reflective mask, method of manufacturing reflective mask blank, and method of manufacturing reflective maskNov 22, 23Jun 04, 24AGC Inc.
11982935 Reflective mask blank for EUV lithographyNov 17, 21May 14, 24AGC INC.
11982936 Photomask and method of fabricating a photomaskJun 30, 22May 14, 24TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
11914283 Reflective mask blank and reflective maskApr 11, 22Feb 27, 24AGC INC.
11822229 Reflective mask blank for EUV lithography, mask blank for EUV lithography, and manufacturing methods thereofJul 22, 21Nov 21, 23AGC Inc.
11809075 EUV lithography mask with a porous reflective multilayer structureAug 04, 21Nov 07, 23Taiwan Semiconductor Manufacturing Co., Ltd.
11774848 Method and apparatus for repairing defects of a photolithographic mask for the EUV rangeJun 28, 21Oct 03, 23Carl Zeiss SMT GmbH
11754917 Extreme ultraviolet mask blank with multilayer absorber and method of manufactureApr 12, 21Sep 12, 23Applied Materials Inc.
11740547 Method of manufacturing extreme ultraviolet mask with reduced wafer neighboring effectApr 29, 21Aug 29, 23TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
11703751 Reflective mask blank and reflective maskSep 01, 21Jul 18, 23AGC INC.
11662656 Mask and method of forming the sameNov 23, 20May 30, 23Taiwan Semiconductor Manufacturing Company Ltd.
11537039 Photomask assembly with reflective photomask and method of manufacturing a reflective photomaskJan 10, 20Dec 27, 22ADVANCED MASK TECHNOLOGY CENTER GMBH & CO. KG
11435660 Photomask and method of fabricating a photomaskApr 30, 18Sep 06, 22Taiwan Semiconductor Manufacturing Co., Ltd.
11372322 EUV mask blank, photomask manufactured by using the EUV mask blank, lithography apparatus using the photomask and method of fabricating semiconductor device using the photomaskJan 06, 21Jun 28, 22Samsung Electronics Co., Ltd.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0102,898 REFLECTIVE MASK BLANK AND MANUFACTURING METHOD OF REFLECTIVE MASKSep 04, 24Mar 27, 25Shin-Etsu Chemical Co., Ltd.
2025/0036,020 REFLECTIVE MASK BLANK, REFLECTIVE MASK BLANK MANUFACTURING METHOD, REFLECTIVE MASK, AND REFLECTIVE MASK MANUFACTURING METHODOct 09, 24Jan 30, 25AGC Inc.
2024/0427,226 REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND MANUFACTURING METHOD THEREFORSep 03, 24Dec 26, 24AGC Inc.
2024/0377,720 EUV Lithography Mask With A Porous Reflective Multilayer StructureJul 22, 24Nov 14, 24Not available
2024/0377,722 MASK AND METHOD OF FORMING THE SAMEJul 22, 24Nov 14, 24Taiwan Semiconductor Manufacturing Company Ltd.
2024/0295,807 REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKApr 29, 24Sep 05, 24AGC Inc.
2024/0280,890 REFLECTIVE MASK BLANK, REFLECTIVE MASK, METHOD OF MANUFACTURING REFLECTIVE MASK BLANK, AND METHOD OF MANUFACTURING REFLECTIVE MASKApr 29, 24Aug 22, 24AGC Inc.
2024/0248,387 METHOD AND SYSTEM TO INTRODUCE BRIGHT FIELD IMAGING AT STITCHING AREA OF HIGH-NA EUV EXPOSUREMay 05, 23Jul 25, 24Not available
2024/0201,576 REFLECTIVE MASK BLANK FOR EUV LITHOGRAPHYFeb 29, 24Jun 20, 24AGC Inc.
2024/0152,003 DISPLAY PANEL, METHOD OF MANUFACTURING DISPLAY PANEL, AND PHOTOMASKMar 29, 23May 09, 24TCL China Star Optoelectronics Technology Co.,Ltd.
2024/0085,779 METHOD AND APPARATUS FOR QUALIFYING A MASK FOR USE IN LITHOGRAPHYSep 08, 23Mar 14, 24Not available
2022/0397,817 REFLECTIVE PHOTOMASK BLANK AND REFLECTIVE PHOTOMASKNov 25, 20Dec 15, 22Not available
2022/0236,636 REFLECTIVE MASK BLANK AND REFLECTIVE MASKApr 11, 22Jul 28, 22AGC INC.
2021/0165,316 PHOTOLITHOGRAPHY METHODJun 19, 20Jun 03, 21Samsung Electronics Co., Ltd.
2020/0073,224 MASK AND METHOD FOR MANUFACTURING THE SAME AND METHOD FOR PATTERNING A LAYERJun 27, 19Mar 05, 20Not available
2019/0384,162 PHOTO-MASK AND METHOD FOR MANUFACTURING ACTIVE SWITCH ARRAY SUBSTRATE THEREOFMay 17, 17Dec 19, 19Not available
2019/0179,225 PHOTOMASKS, METHODS OF MANUFACTURING PHOTOMASKS, AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE USING PHOTOMASKSJun 25, 18Jun 13, 19Not available
2019/0011,829 PHOTOMASK AND METHOD FOR MANUFACTURING ACTIVE SWITCH ARRAY SUBSTRATE USING SAMEMay 31, 17Jan 10, 19Not available

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Patents Issued To Date - By Filing Year

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