G01R 1/28

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Description

Class  G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES


Subclass 1/28: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12191759 Detection circuit for power supply circuitDec 21, 22Jan 07, 25Power Forest Technology Corporation
11960311 Linear voltage regulator with isolated supply currentJul 28, 20Apr 16, 24Medtronic MiniMed Inc.
11841381 Wafer inspection method and inspection apparatusSep 22, 22Dec 12, 23CHROMA ATE INC.
11555864 Optical monitoring to detect contamination of power grid componentsOct 28, 21Jan 17, 23Palo Alto Research Center Incorporated
11506741 Method and apparatus for monitoring secondary power device, and electronic system including the apparatusDec 29, 20Nov 22, 22Samsung Electronics Co., Ltd.
11500013 Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipmentOct 30, 20Nov 15, 22Advantest Corporation
11428723 Method and system for emulating an electromagnetic environment in an anechoic chamberJan 10, 20Aug 30, 22Rohde & Schwarz GmbH & Co. KG
11402438 Intelligent on-line diagnosis and positioning method for winding deformation of power transformersAug 28, 19Aug 02, 22State Grid Zhejiang Electric Power Company Limited Electric Power Research Institute; Hangzhou Kelin Electric Co., Ltd;
11372031 Defect detection in high voltage power supply apparatusSep 11, 19Jun 28, 22Hewlett-Packard Development Company, L.P.
11372049 Method and system to determine power values of a batteryOct 25, 18Jun 28, 22Dell Products L.P.
11163017 Optical monitoring to detect contamination of power grid componentsOct 24, 19Nov 02, 21Palo Alto Research Center Incorporated
10989745 Power meter with fixed segment interactive menuMar 11, 19Apr 27, 21Honeywell International, Inc.
10983149 Inrush current test deviceNov 21, 19Apr 20, 21Chicony Power Technology Co., Ltd.
10955515 Calibrating a power meter with a current transformer in the fieldMar 11, 19Mar 23, 21Honeywell International, Inc.
10908249 Method and apparatus for monitoring secondary power device, and electronic system including the apparatusMar 11, 19Feb 02, 21Samsung Electronics Co., Ltd.
10895588 Apparatus and method for de-embedding a combiner from a balanced signalApr 20, 18Jan 19, 21Tektronix, Inc.
10897840 Shield box, shield box assembly and apparatus for testing a semiconductor deviceJun 09, 17Jan 19, 21Advanced Semiconductor Engineering Korea, Inc.
10823772 Generator waveform measurementMay 13, 19Nov 03, 20Kohler Co.
10762215 Wearable device and data security method thereofNov 30, 17Sep 01, 20Electronics and Telecommunications Research Institute
10551470 Calibration apparatus, calibration system and method for calibrating at least one of the signal generator and a signal analyzerSep 22, 17Feb 04, 20Rohde & Schwarz GmbH & Co. KG

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0093,388 Systems and Methods for Calibrating a Wireless Harness Automated Measurement SystemSep 15, 23Mar 20, 25Not available
2024/0255,556 Sample Inspection ApparatusMay 21, 21Aug 01, 24Not available
2024/0210,980 LINEAR VOLTAGE REGULATOR WITH ISOLATED SUPPLY CURRENTMar 08, 24Jun 27, 24Not available
2024/0118,312 FENCE TESTEROct 05, 23Apr 11, 24Forcefield Active Technology Limited
2024/0109,448 MONITORING ISOLATION RESISTANCE TO VALIDATE VEHICLE CHARGER FUNCTIONALITYSep 29, 22Apr 04, 24Not available
2024/0110,946 DEPTH DETECTOR SYSTEMSOct 04, 23Apr 04, 24Cascade Corporation
2023/0305,037 SENSING ELECTRONIC DEVICEFeb 23, 23Sep 28, 23Not available
2023/0105,201 WAFER INSPECTION METHOD AND INSPECTION APPARATUSSep 29, 22Apr 06, 23Not available
2020/0241,066 INTELLIGENT ON-LINE DIAGNOSIS AND POSITIONING METHOD FOR WINDING DEFORMATION OF POWER TRANSFORMERSAug 28, 19Jul 30, 20Not available
2019/0204,356 Large Dynamic Range Electro-Optic ProbeDec 31, 17Jul 04, 19Tektronix, Inc.

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Patents Issued To Date - By Filing Year

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