Class G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
Subclass 1/16: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Magnets
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12210055 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Jun 20, 23 | Jan 28, 25 | Taiwan Semiconductor Manufacturing Company Ltd. |
| 12128936 | Fault detection device and method for superconducting electrodynamic magnetic levitation (maglev) track | Jul 18, 24 | Oct 29, 24 | Southwest Jiaotong University |
| 11719742 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Aug 08, 22 | Aug 08, 23 | Taiwan Semiconductor Manufacturing Company Ltd. |
| 11693027 | Conductive particle and testing socket comprising the same | Jun 07, 21 | Jul 04, 23 | SNOW CO., LTD. |
| 11644482 | Testing interposer method and apparatus | Jan 13, 21 | May 09, 23 | Texas Instruments Incorporated |
| 11506706 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Dec 18, 20 | Nov 22, 22 | Taiwan Semiconductor Manufacturing Company Ltd. |
| 11162981 | Magnetic field transducer mounting methods for MTJ device testers | Jan 30, 20 | Nov 02, 21 | Integrated Silicon Solution, (Cayman) Inc. |
| 11105831 | Current sensor | Sep 26, 19 | Aug 31, 21 | DENSO Corporation |
| 10962568 | Jig | Feb 06, 18 | Mar 30, 21 | Kabushiki Kaisha Nihon Micronics |
| 10928419 | Interposer, Test Access Port, First and Second Through Silicon Vias | Jan 20, 20 | Feb 23, 21 | Texas Instruments Incorporated |
| 10877089 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | May 14, 19 | Dec 29, 20 | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 10684310 | Magnetic field transducer mounting apparatus for MTJ device testers | Dec 27, 17 | Jun 16, 20 | Spin Memory, Inc. |
| 10234354 | Leak detection | Apr 02, 14 | Mar 19, 19 | IntelliView Technologies Inc. |
| 9914366 | System and method to determine the state of charge of a battery using magnetostriction to detect magnetic response of battery material | Jun 17, 14 | Mar 13, 18 | GM GLOBAL TECHNOLOGY OPERATIONS LLC |
| 9200925 | Absolute high resolution segment or revolution counter | Nov 06, 13 | Dec 01, 15 | AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. |
| 8872519 | System and method to determine the state of charge of a battery using magnetostriction to detect magnetic response of battery material | Aug 21, 09 | Oct 28, 14 | GM GLOBAL TECHNOLOGY OPERATIONS LLC |
| 6538423 | Coil-type meter | Mar 08, 01 | Mar 25, 03 | NIPPON SEIKI CO., LTD. |
| 6046583 | Miniature crossed coil gauge having an active flux ring | Nov 10, 97 | Apr 04, 00 | SIMCO LTD. |
| 5744729 | Sample sucking device | Dec 18, 96 | Apr 28, 98 | TOA MEDICAL ELECTRONICS CO., LTD. |
| 5686832 | Miniature crossed coil gauge having an active flux ring | Oct 26, 95 | Nov 11, 97 | SIMCO LTD. |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0093,387 | WAFER TEST SYSTEM | Mar 29, 24 | Mar 20, 25 | Not available |
| 2024/0367,700 | FAULT DETECTION DEVICE AND METHOD FOR SUPERCONDUCTING ELECTRODYNAMIC MAGNETIC LEVITATION (MAGLEV) TRACK | Jul 18, 24 | Nov 07, 24 | Not available |
| 2020/0166,544 | Magnetic Field Transducer Mounting Methods for MTJ Device Testers | Jan 30, 20 | May 28, 20 | Not available |
| 2019/0195,914 | Magnetic Field Transducer Mounting Apparatus for MTJ Device Testers | Dec 27, 17 | Jun 27, 19 | Not available |
| 2018/0172,733 | MAGNETIC ASSEMBLY AND MAGNETIC CORE SET THEREOF | Jul 20, 17 | Jun 21, 18 | Not available |
| 2017/0045,554 | CIRCUIT PROBING SYSTEM AND ITS CIRCUIT PROBING DEVICE | Nov 05, 15 | Feb 16, 17 | GLOBAL UNICHIP CORPORATION, TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., |
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