G01R 1/07

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Description

Class  G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES


Subclass 1/07: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Measuring leads; Measuring probes (G01R 19/145, G01R 19/165 take precedence; end pieces for leads H01R 11/00) Measuring probes Non contact-making probes

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12253575 Systems and methods for detecting failure of spring contactsJul 07, 22Mar 18, 25Waymo LLC
12235287 Substrate processing apparatusSep 09, 22Feb 25, 25Samsung Electronics Co. Ltd.
12213229 Illumination device, optical camera and method for monitoring an optical output power of a light sourceNov 14, 22Jan 28, 25Infineon Technologies AG
12203983 Contacting module for contacting optoelectronic chipsJan 27, 21Jan 21, 25Jenoptik Optical Systems GmbH
12188962 Amplitude-modulating probe card and its probe and amplitude-modulating structureJul 27, 21Jan 07, 25MAXONE SEMICONDUCTOR CO., LTD.
12146913 Modular wireless communication device testing systemOct 19, 23Nov 19, 24T-Mobile USA Inc.
12123907 Detecting a via stripping issue in a printed circuit boardApr 26, 22Oct 22, 24Dell Products L.P.
12055563 Probe card, apparatus and method for detecting contact force of probe cardAug 30, 21Aug 06, 24TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
12038457 Apparatus and system for generating magnetic fields in inaccessible regionsOct 21, 21Jul 16, 24Keysight Technologies, Inc.
11946950 Electro-optical circuit board for contacting photonic integrated circuitsOct 05, 20Apr 02, 24Carl Zeiss SMT GmbH
11899044 Current sensorJul 28, 22Feb 13, 24DENSO Corporation; 501 Toyota Jidosha Kabushiki Kaisha; MIRISE Technologies Corporation;
11874301 Probe systems including imaging devices with objective lens isolators, and related methodsOct 23, 20Jan 16, 24FormFactor, Inc.
11860191 Probe moduleJun 19, 20Jan 02, 24SUZHOU HYC TECHNOLOGY CO., LTD.
11828802 Modular wireless communication device testing systemNov 21, 22Nov 28, 23T-Mobile USA Inc.
11815531 Current sensorJul 28, 22Nov 14, 23DENSO Corporation; 501 Toyota Jidosha Kabushiki Kaisha; MIRISE Technologies Corporation;
11808787 Probe card testing deviceJun 09, 21Nov 07, 23Unimicron Technology Corp.
11803015 Optical probe for optoelectronic integrated circuitsJun 13, 22Oct 31, 23FOCI Fiber Optic Communications Inc.
11774495 Capacitive test needle for measuring electrically conductive layers in printed circuit board holesJan 17, 19Oct 03, 23ATG LUTHER & MAELZER GMBH
11768225 Removable contactless probeJun 29, 21Sep 26, 23International Business Machine Corporation
11761983 Probe card integrated with a hall sensorSep 13, 21Sep 19, 23GLOBALFOUNDRIES SINGAPORE PTE. LTD.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0060,407 TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUITFeb 06, 24Feb 20, 25Not available
2025/0007,176 APPARATUS OF MULTIFREQUENCY ELECTROMAGNETIC RESONATORS INDUCTIVELY COUPLED TO ONE ANOTHER FORMING AN ARRAY OF RESONATORS OR A METAMATERIAL, AND IMPLEMENTATION METHODNov 18, 22Jan 02, 25UNIVERSITE PARIS-SACLAY; Centre National De La Recherche Scientifique (CNRS); CY CERGY PARIS UNIVERSITÉ;
2024/0393,365 ROTATING BODY INSPECTION DEVICE FOR ELECTRIFICATION COMPONENTDec 19, 22Nov 28, 24Not available
2024/0369,599 PROBE CARD DEVICEApr 30, 24Nov 07, 24Silicon Future Manufacturing Company Ltd.
2024/0361,362 CURRENT SENSORJul 09, 24Oct 31, 24Not available
2024/0230,718 VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIASOct 24, 22Jul 11, 24Not available
2024/0219,452 METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENABLING MICROPROCESSOR DEBUG, AT HIGH SPEED, INSIDE AN ELECTRON BEAM PROBEDec 28, 22Jul 04, 24Not available
2024/0133,921 VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIASOct 23, 22Apr 25, 24Not available
2024/0103,041 INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITYSep 27, 23Mar 28, 24Not available
2024/0085,493 FLEXIBLE PROBE FOR MICROLED DEFECT DETECTION AND MANUFACTURING METHOD THEREFOROct 21, 21Mar 14, 24INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG
2021/0208,182 PROBE CARD, PROBING SYSTEM AND PROBING METHODFeb 06, 20Jul 08, 21Not available
2021/0033,643 ELECTRO-OPTICAL CIRCUIT BOARD FOR CONTACTING PHOTONIC INTEGRATED CIRCUITSOct 05, 20Feb 04, 21Not available
2019/0204,356 Large Dynamic Range Electro-Optic ProbeDec 31, 17Jul 04, 19Tektronix, Inc.
2019/0137,543 TESTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICEJun 01, 18May 09, 19Not available
2018/0336,162 METHOD AND DEVICE FOR RECONSTRUCTING A USEFUL SIGNAL FROM A NOISY ACQUIRED SIGNALJul 31, 18Nov 22, 18Centre National d'Etudes Spatiales; UNIVERSITE DE BOURGOGNE;
2017/0030,955 Wireless Power Line SensorOct 10, 16Feb 02, 17SKY SIGHT TECHNOLOGIES, LLC
2017/0019,170 Dual-Directional Electro-Optic ProbeMar 07, 14Jan 19, 17KEYSIGHT TECHNOLOGIES, INC.

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Patents Issued To Date - By Filing Year

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