| 12265100 | Electrical testing device with probe having portions with different cross-sectional areas | Feb 23, 23 | Apr 01, 25 | Snap-On Incorporated |
| 12265101 | Load pull tuner for waveguide wafer probe | Apr 12, 23 | Apr 01, 25 | Not available |
| 12259405 | Adjustment control device for precise measurement | Dec 18, 22 | Mar 25, 25 | PAMTEK Co., Ltd. |
| 12259406 | Elastic electrical contact device and contact conductor thereof | Mar 01, 23 | Mar 25, 25 | SUNLIT PRECISION TECHNOLOGY CO., LTD. |
| 12259407 | Contact probe for probe heads of electronic devices | Aug 03, 21 | Mar 25, 25 | Technoprobe S.p.A, |
| 12248002 | Constant force ultrasound probe handle | Aug 01, 22 | Mar 11, 25 | NEW YORK SOCIETY FOR THE RELIEF OF THE RUPTURED AND CRIPPLED, MAINTAINING THE HOSPITAL FOR SPECIAL SURGERY |
| 12248003 | Clustered rigid wafer test probe | Dec 06, 22 | Mar 11, 25 | International Business Machine Corporation |
| 12248012 | Method for producing a probe used for testing integrated electronic circuits | Sep 22, 23 | Mar 11, 25 | STMicroelectronics S.r.l. |
| 12241913 | Contact probe, probe holder and probe unit | Jan 30, 23 | Mar 04, 25 | NHK Spring Co., Ltd. |
| 12235287 | Substrate processing apparatus | Sep 09, 22 | Feb 25, 25 | Samsung Electronics Co. Ltd. |
| 12235314 | Parallel test cell with self actuated sockets | Jul 29, 22 | Feb 25, 25 | ADVANTEST TEST SOLUTIONS, INC. |
| 12228590 | Wafer probe device | Sep 19, 23 | Feb 18, 25 | Winbond Electronics Corp. |
| 12228591 | Busbar as current sensor | Nov 25, 20 | Feb 18, 25 | EATON INTELLIGENT POWER LIMITED |
| 12222367 | Contact pins for test sockets and test sockets comprising the same | Apr 04, 23 | Feb 11, 25 | Okins Electronics Co. Ltd. |
| 12222368 | Liquid analysis device and sensor unit | May 15, 20 | Feb 11, 25 | HORIBA ADVANCED TECHNO, CO., LTD. |
| 12222370 | Probe head and probe card having same | Apr 20, 21 | Feb 11, 25 | POINT ENGINEERING CO., LTD. |
| 12216076 | Vascular sap measurement sensor | Oct 08, 20 | Feb 04, 25 | National University Corporation Kagawa University |
| 12216139 | Adaptive flexible chip test socket and formation method thereof | Feb 05, 24 | Feb 04, 25 | SEMIGHT INSTRUMENTS CO., LTD |
| 12216156 | Chip test pressing-down apparatus and formation method thereof | Feb 05, 24 | Feb 04, 25 | SEMIGHT INSTRUMENTS CO., LTD |
| 12210037 | Probe array and probe structure | Jan 06, 23 | Jan 28, 25 | VUETTE PTE. LTD. |
