G01R 1/04

Sub-Class

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Description

Class  G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES


Subclass 1/04: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00) Housings; Supporting members; Arrangements of terminals

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12265101 Load pull tuner for waveguide wafer probeApr 12, 23Apr 01, 25Not available
12265119 Repackaging IC chip for fault identificationMar 30, 23Apr 01, 25TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
12265136 Method and system for thermal control of devices in electronics testerSep 05, 24Apr 01, 25Aehr Test Systems
12259431 Experimental multifunctional power supply processing device and experimental detection apparatus for connectorsMay 11, 21Mar 25, 25GUANG'AN ELECTRICAL TESTING CENTER (GUANGDONG) CO., LTD.
12253541 Pogo pin cooling system and method and electronic device testing apparatus having the systemOct 28, 22Mar 18, 25CHROMA ATE INC.
12248000 Radio frequency performance characterization of multi-carrier broadband devicesOct 05, 23Mar 11, 25Charter Communications Operating, LLC
12248001 Lidless BGA socket apparatus for testing semiconductor deviceApr 15, 19Mar 11, 25HICON CO., LTD.;
12241912 Socketless or flush mount QFN (quad flat no lead) test board, fixture, and methodOct 21, 22Mar 04, 25Raytheon Company
12241926 Test apparatusOct 27, 21Mar 04, 25Advantest Corporation; TOEI SCIENTIFIC INDUSTRIAL CO., LTD.;
12235286 Shield box for testing mobile telecommunication terminalDec 30, 22Feb 25, 25INNOWIRELESS CO. LTD.
12235287 Substrate processing apparatusSep 09, 22Feb 25, 25Samsung Electronics Co. Ltd.
12235314 Parallel test cell with self actuated socketsJul 29, 22Feb 25, 25ADVANTEST TEST SOLUTIONS, INC.
12237236 Cartridge for inspectionJul 15, 21Feb 25, 25VueReal Inc.
12228590 Wafer probe deviceSep 19, 23Feb 18, 25Winbond Electronics Corp.
12228591 Busbar as current sensorNov 25, 20Feb 18, 25EATON INTELLIGENT POWER LIMITED
12230481 Plasma reactor having array of coaxial multiple pins and processing low temperature plasma at high efficiencyFeb 13, 23Feb 18, 25HANGZHOU CITY UNIVERSITY
12222366 Current sensor assembly and inverter assembly having a plurality of sensorsApr 27, 20Feb 11, 25LG Magna e-Powertrain Co., Ltd.
12222367 Contact pins for test sockets and test sockets comprising the sameApr 04, 23Feb 11, 25Okins Electronics Co. Ltd.
12216139 Adaptive flexible chip test socket and formation method thereofFeb 05, 24Feb 04, 25SEMIGHT INSTRUMENTS CO., LTD
12216154 Active thermal interposer deviceMay 31, 23Feb 04, 25ADVANTEST TEST SOLUTIONS, INC.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0116,683 UNIVERSAL MATE-IN CABLE INTERFACE SYSTEMDec 18, 24Apr 10, 25Not available
2025/0116,684 SEMICONDUCTOR PACKAGE INSPECTION DEVICESep 19, 24Apr 10, 25Not available
2025/0102,537 Process for Manufacturing an Electric Current Sensor by Additive ManufacturingSep 27, 24Mar 27, 25Commissariat à l'Energie Atomique et aux Energies Alternatives; LEACH INTERNATIONAL EUROPE SAS;
2025/0102,538 TEST SOCKET FOR IC TESTING AND MANUFACTURING METHOD THEREOFMay 29, 24Mar 27, 25Not available
2025/0105,379 BATTERY CELL TESTING UNIT AND BATTERY CELL TESTING SYSTEMJan 19, 23Mar 27, 25AVL List GmbH
2025/0093,408 ACTIVE THERMAL INTERPOSER DEVICEDec 05, 24Mar 20, 25Not available
2025/0093,387 WAFER TEST SYSTEMMar 29, 24Mar 20, 25Not available
2025/0076,340 INTEGRATED CIRCUIT CONDUCTIVE STRUCTURE FOR CIRCUIT PROBE TESTINGSep 01, 23Mar 06, 25Not available
2025/0067,772 SOCKET AND INSPECTION SOCKETAug 25, 23Feb 27, 25Not available
2025/0067,773 SOCKET AND INSPECTION SOCKETAug 25, 23Feb 27, 25Not available
2025/0052,782 INSPECTION SOCKETAug 08, 24Feb 13, 25Yokowo Co., Ltd.
2025/0044,320 DETACHABLE PROTECTIVE STRUCTURE OF DETECTION DEVICEJul 31, 23Feb 06, 25Not available
2025/0035,689 MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUREMENT JIGMay 24, 24Jan 30, 25Mitsubishi Electric Corporation
2025/0040,095 PHASE-CHANGE TEMPERATURE REGULATING SYSTEM AND ELECTRONIC COMPONENT TESTING APPARATUS AND METHODMay 10, 24Jan 30, 25CHROMA ATE INC.
2025/0027,972 DATA SIGNAL TRANSMISSION CONNECTOR AND MANUFACTURING METHOD FOR THE SAMEJul 11, 24Jan 23, 25TSE CO., LTD
2025/0027,987 INSPECTION SYSTEM WITH THERMAL INTERFACE, AND ELECTRONIC COMPONENT INSPECTION DEVICE AND METHODMay 13, 24Jan 23, 25CHROMA ATE INC.
2025/0020,687 ADAPTIVE CHIP TESTING APPARATUS AND FORMATION METHOD THEREOFFeb 06, 24Jan 16, 25Not available
2025/0020,688 TEST SOCKET FOR 224GBPS ULTRA-HIGH-SPEED COAXIAL TESTINGMay 17, 24Jan 16, 25Not available
2025/0012,830 TESTING DEVICE AND ITS ADAPTER HOLDERApr 17, 24Jan 09, 25Not available
2025/0004,011 TEST SOCKET FOR PREVENTING SIGNAL LOSSSep 16, 24Jan 02, 25Not available

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Patents Issued To Date - By Filing Year

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