Class G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
Subclass 1/02: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00)
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12265101 | Load pull tuner for waveguide wafer probe | Apr 12, 23 | Apr 01, 25 | Not available |
| 12260078 | Dynamic webpage interface for an intelligent electronic device | Jun 17, 15 | Mar 25, 25 | EI Electronics LLC |
| 12235142 | Measurement device and method for controlling the same | Jun 22, 18 | Feb 25, 25 | Rohde & Schwarz GmbH & Co. KG |
| 12235314 | Parallel test cell with self actuated sockets | Jul 29, 22 | Feb 25, 25 | ADVANTEST TEST SOLUTIONS, INC. |
| 12228590 | Wafer probe device | Sep 19, 23 | Feb 18, 25 | Winbond Electronics Corp. |
| 12228591 | Busbar as current sensor | Nov 25, 20 | Feb 18, 25 | EATON INTELLIGENT POWER LIMITED |
| 12216139 | Adaptive flexible chip test socket and formation method thereof | Feb 05, 24 | Feb 04, 25 | SEMIGHT INSTRUMENTS CO., LTD |
| 12216156 | Chip test pressing-down apparatus and formation method thereof | Feb 05, 24 | Feb 04, 25 | SEMIGHT INSTRUMENTS CO., LTD |
| 12217596 | Monitor system for surge protection devices | Oct 20, 22 | Feb 04, 25 | ERICO International Corporation |
| 12203869 | Lighting fixture and multi-station lighting system | Dec 16, 21 | Jan 21, 25 | SUZHOU CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. |
| 12203958 | Shielded socket and carrier for high-volume test of semiconductor devices | Sep 30, 23 | Jan 21, 25 | ADVANTEST TEST SOLUTIONS, INC. |
| 12199691 | Waveguide component for high frequency testing | Feb 16, 24 | Jan 14, 25 | SAGE Millimeter, Inc. |
| 12181492 | Probe head and substrate inspection device including the same | Mar 04, 24 | Dec 31, 24 | Not available |
| 12174248 | Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system | Jun 02, 22 | Dec 24, 24 | ADVANTEST TEST SOLUTIONS, INC. |
| 12163982 | Microbump cluster probing architecture for 2.5D and 3D dies | Mar 31, 22 | Dec 10, 24 | Intel Corp. |
| 12158482 | Probe card assembly | Oct 25, 21 | Dec 03, 24 | MediaTek Inc. |
| 12153083 | Test fixture for printed circuit board components | Apr 24, 23 | Nov 26, 24 | Aptiv Technologies AG |
| 12153087 | Apparatus and method for testing all test circuits on a wafer from a single test site | Jun 24, 22 | Nov 26, 24 | IC ANALYTICA, LLC |
| 12146897 | Vertical probe card having different probes | Nov 03, 22 | Nov 19, 24 | CHUNGHWA PRECISION TEST TECH. CO., LTD. |
| 12123897 | Dielectric resonating test contactor and method | Dec 18, 20 | Oct 22, 24 | Xcerra Corporation |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0093,382 | Wireless Harness Automated Measurement Systems and Methods | Sep 15, 23 | Mar 20, 25 | Not available |
| 2024/0370,532 | SECURITY THROUGH LAYERS IN AN INTELLIGENT ELECTRONIC DEVICE | Jul 18, 24 | Nov 07, 24 | Not available |
| 2024/0248,116 | TACTILE ELECTRICAL CONNECTION INDICATOR | Jan 19, 23 | Jul 25, 24 | Not available |
| 2024/0230,742 | TESTING SYSTEMS AND METHODS | Aug 30, 22 | Jul 11, 24 | Kinney Industries, Inc. |
| 2024/0201,243 | Testing Systems and Methods | Aug 30, 22 | Jun 20, 24 | Kinney Industries, Inc. |
| 2023/0045,809 | METHOD FOR AUTOMATICALLY CLEANING A PROBE CARD AND SYSTEM FOR AUTOMATICALLY PERFORMING A NEEDLE CLEANING | Aug 11, 21 | Feb 16, 23 | Not available |
| 2023/0045,153 | METHOD AND APPARATUS FOR DISPLAYING MEASUREMENT PARAMETERS | Jan 13, 21 | Feb 09, 23 | Schneider Electric Industries SAS |
| 2022/0404,393 | Testing Device for a Medium Voltage Starter | Jun 16, 22 | Dec 22, 22 | Not available |
| 2022/0206,040 | SWITCHING MATRIX SYSTEM AND OPERATING METHOD THEREOF FOR SEMICONDUCTOR CHARACTERISTIC MEASUREMENT | Dec 30, 20 | Jun 30, 22 | Not available |
| 2020/0200,819 | AUTOMATED TEST EQUIPMENT (ATE) SUPPORT FRAMEWORK FOR SOLID STATE DEVICE (SSD) ODD SECTOR SIZES AND PROTECTION MODES | Dec 20, 18 | Jun 25, 20 | Not available |
| 2018/0356,443 | INSTRUMENT KNOB BACKLIGHT STRUCTURE AND INSTRUMENT | Oct 16, 15 | Dec 13, 18 | Not available |
| 2016/0231,354 | Dynamically Configurable Remote Instrument Interface | Feb 04, 16 | Aug 11, 16 | KEITHLEY INSTRUMENTS, LLC |
| 2016/0178,660 | METER PULLER HAVING GRIPPING INSERTS | Feb 29, 16 | Jun 23, 16 | KILVERT, LLC |
| 2014/0184,263 | SENSOR SYSTEM AND COVER DEVICE FOR A SENSOR SYSTEM | Dec 19, 13 | Jul 03, 14 | ROBERT BOSCH GMBH |
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