Description
Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 40/00: Calibration, e.g. of probes
G01Q 40/00
Sub-Class
Stats
- 44 US PATENTS IN FORCE
- 7 US APPLICATIONS PENDING
- 20 Total Patent Owners
- 131 TOTAL INVENTORS
Recent Patents
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 11733265 | Method of imaging a surface using a scanning probe microscope | Oct 23, 20 | Aug 22, 23 | INFINITESIMA LIMITED |
| 10928418 | Scanning probe microscope | Jun 28, 18 | Feb 23, 21 | INFINITESIMA LIMITED |
| 10900878 | Torsional and lateral stiffness measurement | Aug 15, 13 | Jan 26, 21 | THE UNIVERSITY COURT OF THE UNIVERSITY OF ST ANDREWS |
| 10746702 | Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product | Apr 13, 17 | Aug 18, 20 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 10718697 | Method for estimating a stiffness of a deformable part | Dec 29, 16 | Jul 21, 20 | Centre National De La Recherche Scientifique (CNRS); Ecole Normale Superieure de Lyon; UNIVERSITE CLAUDE BERNARD - LYON 1; |
| 10663874 | Alignment system and method | Nov 10, 16 | May 26, 20 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 10605826 | Calibrating tip-enhanced Raman microscopes | Jun 17, 18 | Mar 31, 20 | International Business Machine Corporation |
| 10578643 | Determining interaction forces in a dynamic mode AFM during imaging | Aug 17, 16 | Mar 03, 20 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 10556793 | Thermal measurements using multiple frequency atomic force microscopy | Mar 28, 17 | Feb 11, 20 | Oxford Instruments Asylum Research, Inc. |
| 10493558 | Nanoprocessing and heterostructuring of silk | Aug 14, 18 | Dec 03, 19 | Indian Institute of Science Education and Research |
| 10444258 | AM/FM measurements using multiple frequency atomic force microscopy | Dec 11, 17 | Oct 15, 19 | Oxford Instruments Asylum Research, Inc. |
| 10444259 | Automatic calibration and tuning of feedback systems | Aug 24, 16 | Oct 15, 19 | Technion Research & Development Foundation Limited |
| 10254306 | Probe calibration or measurement routine | Nov 29, 13 | Apr 09, 19 | INFINITESIMA LIMITED |
| 10139429 | Method for calibrating and imaging using multi-tip scanning probe microscope | May 09, 17 | Nov 27, 18 | FEI Company |
| 10126326 | Atomic force microscopy of scanning and image processing | Oct 02, 15 | Nov 13, 18 | Seagate Technology, LLC |
| 10107834 | Measurement system | Mar 20, 17 | Oct 23, 18 | INFINITESIMA LIMITED |
| 10006935 | Scanning electrochemical microscopy | May 01, 13 | Jun 26, 18 | The University of Warwick |
| 9921242 | Automated atomic force microscope and the operation thereof | Jul 05, 16 | Mar 20, 18 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
| 9863766 | Calibration of a contact probe | Jun 26, 14 | Jan 09, 18 | RENISHAW PLC |
| 9841436 | AM/FM measurements using multiple frequency of atomic force microscopy | Sep 26, 16 | Dec 12, 17 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
Recent Publications
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0295,583 | POSITIONING SYSTEM AND METHOD | Jan 24, 22 | Sep 05, 24 | Not available |
| 2024/0210,442 | METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICE | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0168,052 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Mar 26, 21 | May 23, 24 | Not available |
| 2024/0118,310 | DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE | Jan 20, 22 | Apr 11, 24 | Not available |
| 2023/0194,567 | METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Aug 01, 22 | Jun 22, 23 | Samsung Electronics Co., Ltd.; Korea Advanced Institute of Science and Technology; |
| 2020/0141,970 | SCANNING PROBE MICROSCOPE | Jun 28, 18 | May 07, 20 | Not available |
Top Owners in This Subclass
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Patents Issued To Date - By Filing Year
Average Time to Issuance
- 32 Months (last 2 years Issuances)
- 32 Months (last 5 years Issuances)