Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 30/18: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 11835545 | Systems, method and computer-accessible medium for providing balanced asymmetric interferometry for vibrationally isolated optical scanning probe(s) | Jan 14, 21 | Dec 05, 23 | The Trustees of Columbia University in the City of New York |
| 10955437 | Frequency modulation detection for photo induced force microscopy | Jan 30, 18 | Mar 23, 21 | MOLECULAR VISTA, INC. |
| 10866172 | System and method for preparing cryo-em grids | Jul 24, 20 | Dec 15, 20 | Neptune Fluid Flow Systems LLC |
| 10830791 | Sample container mounting member and sample container sealing method | Mar 08, 19 | Nov 10, 20 | Shimadzu Corporation |
| 10697997 | Scanning probe microscope | Jun 02, 16 | Jun 30, 20 | Shimadzu Corporation |
| 10598691 | Scanning probe microscope and light intensity adjusting method | Mar 01, 19 | Mar 24, 20 | SHIMADZU CORPORATION |
| 10539590 | High magnetic field scanning probe microscope employing liquid helium-free room-temperature bore superconducting magnet | Dec 16, 16 | Jan 21, 20 | FUDAN UNIVERSITY |
| 10416190 | Modular atomic force microscope with environmental controls | Feb 28, 17 | Sep 17, 19 | Oxford Instruments Asylum Research, Inc. |
| 10175263 | Sample vessel retention structure for scanning probe microscope | Jun 15, 16 | Jan 08, 19 | Bruker Nano, Inc. |
| 10073116 | Scanning probe microscope and its sample holder | Dec 24, 14 | Sep 11, 18 | Hitachi Ltd. |
| 9897626 | Scanning probe microscope with a reduced Q-factor | Oct 05, 15 | Feb 20, 18 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 9581616 | Modular atomic force microscope with environmental controls | Aug 04, 15 | Feb 28, 17 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
| 9110093 | Sealed AFM cell | Nov 15, 12 | Aug 18, 15 | NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY |
| 8893309 | Scanning tunneling microscope assembly, reactor, and system | Jun 22, 10 | Nov 18, 14 | THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
| 8813261 | Scanning probe microscope | Aug 23, 13 | Aug 19, 14 | HITACHI HIGH-TECH SCIENCE CORPORATION |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2019/0293,680 | SCANNING PROBE MICROSCOPE | Jun 02, 16 | Sep 26, 19 | Shimadzu Corporation |
| Upgrade to the Professional Level to view Top Owners for this Subclass.Learn More |
|---|
