G01Q 30/14

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Description

Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 30/14: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Fluid environment Liquid environment

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
11906546 Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imagingJul 06, 20Feb 20, 24Massachusetts Institute of Technology; Nano Analytik GMBH; Synsfuels Americas Corporation;
11668729 Atomic force microscopeJul 16, 20Jun 06, 23Paris Sciences Et Lettres—Quartier Latin; CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS); Sorbonne Universite; UNIVERSITÉ PARIS CITÉ;
11499990 Atomic force microscope probes and methods of manufacturing probesNov 30, 19Nov 15, 22Nanosurf AG
11262379 Treatment of living organisms based on gravitational resonances and kukharev region dataJan 12, 21Mar 01, 22Not available
11143581 Method and apparatus for chemical mapping by selective dissolutionFeb 28, 19Oct 12, 21University of Huddersfield
11067597 Method of performing atomic force microscopy with an ultrasound transducerNov 02, 18Jul 20, 21NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
10908069 In situ tribometer and methods of useMay 17, 17Feb 02, 21The Trustees of the University of Pennsylvania
10866172 System and method for preparing cryo-em gridsJul 24, 20Dec 15, 20Neptune Fluid Flow Systems LLC
10828785 Integrated measurement and micromechanical positioning apparatus for real-time test controlOct 13, 15Nov 10, 20SENSAPEX OY
10794931 Scanning probe microscope and cantilever moving methodFeb 25, 19Oct 06, 20SHIMADZU CORPORATION
10768202 Systems and methods for nano-tribological manufacturing of nanostructuresAug 29, 16Sep 08, 20The Trustees of the University of Pennsylvania
10712365 Microfluidic cell for atomic force microscopyAug 03, 18Jul 14, 20New Jersey Institute of Technology
10545169 Top-cover for a controlled environmental system, top-cover-set and controlled environmental system compatible with probe based techniques and procedure to control the environment for a sampleJul 15, 16Jan 28, 20ETH Zurich; UNIVERSITÄT BASEL;
10527645 Compact probe for atomic-force microscopy and atomic-force microscope including such a probeJul 12, 16Jan 07, 20VMICRO; Centre National De La Recherche Scientifique (CNRS);
10354833 Sample holder, fixing member and method for fixing sampleApr 30, 18Jul 16, 19Shimadzu Corporation
10234369 Method and apparatus for chemical mapping by selective dissolutionFeb 13, 15Mar 19, 19University of Hudderfield
10215686 Metal corrosion resistance evaluation method and evaluation device using in-liquid potential measurementJul 22, 13Feb 26, 19Hitachi, Ltd.
10175263 Sample vessel retention structure for scanning probe microscopeJun 15, 16Jan 08, 19Bruker Nano, Inc.
10156585 Cantilevered probes having piezoelectric layer, treated section, and resistive heater, and method of use for chemical detectionAug 03, 16Dec 18, 18Board of Regents of the Nevada System of Higher Education on Behalf of the University of Nevada Reno
10073116 Scanning probe microscope and its sample holderDec 24, 14Sep 11, 18Hitachi Ltd.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2024/0118,310 DEVICE FOR MEASURING AND/OR MODIFYING A SURFACEJan 20, 22Apr 11, 24Not available
2019/0072,582 MICROFLUIDIC CELL FOR ATOMIC FORCE MICROSCOPYAug 03, 18Mar 07, 19New Jersey Institute of Technology

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