Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 30/10: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Thermal environment
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12247998 | Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes | Sep 22, 22 | Mar 11, 25 | The Research Foundation for the State University of New York; Yale University; |
| 11592460 | Scanning probe microscope, scan head and method | Dec 03, 19 | Feb 28, 23 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 11150266 | Scanning probe nanotomograph comprising an optical analysis module | May 18, 17 | Oct 19, 21 | PRIVATE INSTITUTION "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM" |
| 11047877 | Initiating and monitoring the evolution of single electrons within atom-defined structures | Sep 28, 18 | Jun 29, 21 | QUANTUM SILICON INC. |
| 10900997 | Low drift system for a metrology instrument | Nov 26, 19 | Jan 26, 21 | Bruker Nano, Inc. |
| 10740948 | Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent | Jan 12, 17 | Aug 11, 20 | Hanbat National University Industry-Academic Cooperation Foundation |
| 10690698 | Scanning probe microscope combined with a device for acting on a probe and a specimen | May 18, 17 | Jun 23, 20 | Chastnoe Uchrezhdenie “Nazarbayev University Research and Innovation System” |
| 10627424 | Cryogenic cooling system | May 26, 17 | Apr 21, 20 | Oxford Instruments Nanotechnology Tools Limited |
| 10436562 | Surface measurement probe | Nov 02, 15 | Oct 08, 19 | ANTON PAAR TRITEC SA |
| 10416190 | Modular atomic force microscope with environmental controls | Feb 28, 17 | Sep 17, 19 | Oxford Instruments Asylum Research, Inc. |
| 10168261 | Structure for achieving dimensional stability during temperature changes | Mar 22, 16 | Jan 01, 19 | KLA-TENCOR Corporation |
| 9581616 | Modular atomic force microscope with environmental controls | Aug 04, 15 | Feb 28, 17 | OXFORD INSTRUMENTS ASYLUM RESEARCH, INC |
| 9476816 | Probe tip heating assembly | Nov 14, 12 | Oct 25, 16 | HYSITRON, INC. |
| 9116168 | Low drift scanning probe microscope | Oct 21, 14 | Aug 25, 15 | BRUKER NANO, INC. |
| 9097632 | Device for the light stimulation and cryopreservation of biological samples | Feb 27, 13 | Aug 04, 15 | LEICA MIKROSYSTEME GMBH |
| 9081029 | Apparatus for mechanically robust thermal isolation of components | Jan 30, 12 | Jul 14, 15 | The United States of America as represented by the Secretary of the Army |
| 9062905 | Low temperature device with low-vibration sample holding device | Dec 07, 09 | Jun 23, 15 | HB PATENT UNTERNEHMERGESELLSCHAFT |
| 8997259 | Method and apparatus of tuning a scanning probe microscope | Nov 12, 12 | Mar 31, 15 | BRUKER NANO, INC. |
| 8763161 | Zero thermal expansion, low heat transfer, variable temperature sample assembly for probe microscopy | Sep 19, 12 | Jun 24, 14 | THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE |
| 8370960 | Modular atomic force microscope | Oct 14, 09 | Feb 05, 13 | OXFORD INSTRUMENTS AFM INC, OXFORD INSTRUMENTS PLC, |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2021/0325,429 | INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN ATOM-DEFINED STRUCTURES | Jun 29, 21 | Oct 21, 21 | QUANTUM SILICON INC.; National Research Council of Canada; The University of British Columbia; |
| 2020/0166,540 | Low Drift System for a Metrology Instrument | Nov 26, 19 | May 28, 20 | Not available |
| 2019/0317,125 | MICROSCOPY SAMPLE STAGE FOR GAS HYDRATE TESTS AND TEMPERATURE AND PRESSURE CONTROLLING SYSTEM OF THE STAGE | Apr 16, 19 | Oct 17, 19 | Not available |
| 2019/0310,283 | Cryogenic Cooling System | May 26, 17 | Oct 10, 19 | Oxford Instruments Nanotechnology Tools Limited |
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