Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 30/00: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 11808783 | Atomic force microscopy apparatus, methods, and applications | Oct 21, 21 | Nov 07, 23 | Cornell University |
| 11694227 | Forming and using master records based on consumer transaction data | Sep 30, 21 | Jul 04, 23 | QUOTIENT TECHNOLOGY INC. |
| 11175306 | Atomic force microscopy apparatus, methods, and applications | May 10, 18 | Nov 16, 21 | Cornell Research Foundation Inc. Cornell University |
| 11162975 | Surface analyzer | Jan 25, 21 | Nov 02, 21 | Shimadzu Corporation |
| 10712364 | Metrology devices for rapid specimen setup | Nov 03, 16 | Jul 14, 20 | Board of Regents The University of Texas Systems |
| 10274711 | Microscopic image recognition system and method for detecting protein-based molecule | Jul 19, 17 | Apr 30, 19 | I Shou University |
| 9939460 | Scanning probe system with multiple probes | Jun 08, 17 | Apr 10, 18 | INFINITESIMA LIMITED |
| 9404855 | Method to obtain absorption spectra from near-field infrared scattering using homo-dyne detection | Nov 27, 13 | Aug 02, 16 | Not available |
| 9252004 | Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging system | Jul 30, 14 | Feb 02, 16 | CANON KABUSHIKI KAISHA |
| 8997259 | Method and apparatus of tuning a scanning probe microscope | Nov 12, 12 | Mar 31, 15 | BRUKER NANO, INC. |
| 8914909 | Frequency measuring and control apparatus with integrated parallel synchronized oscillators | Mar 17, 11 | Dec 16, 14 | RHK TECHNOLOGY, INC. |
| 8887311 | Scanning probe microscope | Nov 08, 13 | Nov 11, 14 | SHIMADZU CORPORATION |
| 8860260 | High-scan rate positioner for scanned probe microscopy | Dec 17, 12 | Oct 14, 14 | MASSACHUSETTS INSTITUTE OF TECHNOLOGY |
| 8448502 | Band excitation method applicable to scanning probe microscopy | Jun 02, 10 | May 28, 13 | UT-BATTELLE, LLC |
| 8308968 | Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth | Aug 05, 09 | Nov 13, 12 | GLOBALFOUNDRIES INC. |
| 7825343 | Systems and methods for providing information to a customer | May 08, 08 | Nov 02, 10 | Invatron Systems Corp. |
| 7793356 | Signal coupling system for scanning microwave microscope | Sep 11, 08 | Sep 07, 10 | KEYSIGHT TECHNOLOGIES, INC. |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2018/0321,277 | METROLOGY DEVICES FOR RAPID SPECIMEN SETUP | Nov 03, 16 | Nov 08, 18 | Not available |
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