G01Q 20/02

Sub-Class

Watch

Stats

Description

Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 20/02: Monitoring the movement or position of the probe by optical means

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12181773 Truncated nonlinear interferometer-based sensor systemJan 23, 23Dec 31, 24UT - Battelle LLC
12163979 Nano robotic system for high throughput single cell DNA sequencingOct 27, 22Dec 10, 24Versitech Limited; City University of Hong Kong;
12055560 Automated optimization of AFM light source positioningMar 21, 23Aug 06, 24Oxford Instruments Asylum Research, Inc.
RE49997 Metrological scanning probe microscopeJul 01, 21Jun 04, 24Oxford Instruments Asylum Research, Inc.
11964310 Debris removal from high aspect structuresJan 06, 23Apr 23, 24Bruker Nano, Inc.
11892471 Method and device for simultaneous independent motion measurement of multiple probes in atomic force microscopeMay 08, 21Feb 06, 24Shenyang Institute of Automation, Chinese Academy of Sciences
11846653 Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequenciesDec 17, 20Dec 19, 23MOLECULAR VISTA, INC.
11835545 Systems, method and computer-accessible medium for providing balanced asymmetric interferometry for vibrationally isolated optical scanning probe(s)Jan 14, 21Dec 05, 23The Trustees of Columbia University in the City of New York
11815527 3D multipurpose scanning microscopy probesNov 05, 21Nov 14, 23Mount Sinai of Medicine of New York University
11796563 Apparatus and method for a scanning probe microscopeJan 25, 22Oct 24, 23Carl Zeiss SMT GmbH
11789037 Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscopeMay 08, 21Oct 17, 23Shenyang Institute of Automation, Chinese Academy of Sciences
11733265 Method of imaging a surface using a scanning probe microscopeOct 23, 20Aug 22, 23INFINITESIMA LIMITED
11733264 Cantilever, scanning probe microscope, and measurement method using scanning probe microscopeApr 30, 20Aug 22, 23HITACHI HIGH-TECH CORPORATION
11709180 Atomic force microscope using artificial intelligence object recognition technology and operation method thereofMay 11, 21Jul 25, 23Chungbuk National University Industry Academic Cooperation Foundation
11680963 Method and apparatus for examining a measuring tip of a scanning probe microscopeDec 15, 21Jun 20, 23Carl Zeiss SMT GmbH
11668730 High speed atomic force profilometry of large areasApr 06, 21Jun 06, 23Bruker Nano, Inc.
11592461 Apparatus and method for examining and/or processing a sampleFeb 25, 22Feb 28, 23Carl Zeiss SMT GmbH
11577286 Debris removal in high aspect structuresJun 15, 21Feb 14, 23Bruker Nano, Inc.
11579168 Probe for detecting near field and near-field detecting system including the sameSep 29, 21Feb 14, 23Samsung Electronics Co. Ltd.
11561453 Truncated non-linear interferometer-based sensor systemSep 10, 21Jan 24, 23UT-BATTELLE, LLC

more results

Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2024/0426,870 SCANNING PROBE MICROSCOPEMar 16, 22Dec 26, 24Not available
2024/0369,595 LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPEJun 10, 22Nov 07, 24Not available
2024/0295,583 POSITIONING SYSTEM AND METHODJan 24, 22Sep 05, 24Not available
2024/0269,717 DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURESApr 22, 24Aug 15, 24Not available
2024/0275,130 LASER DIODE ARRANGEMENT, METHOD OF OPERATING A LASER DIODE AND SCANNING MICROSCOPE DEVICE COMPRISING A LASER DIODEJul 08, 22Aug 15, 24Not available
2024/0210,442 METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTICAL MICROSCOPE, CALIBRATION STRUCTURE AND SCANNING PROBE MICROSCOPY DEVICEApr 28, 22Jun 27, 24Not available
2024/0110,939 AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAMEFeb 09, 22Apr 04, 24Not available
2024/0077,516 SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MAPPINGAug 08, 23Mar 07, 24Not available
2024/0069,095 DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE MICROSCOPYAug 26, 22Feb 29, 24Not available
2024/0012,021 ATOMIC FORCE MICROSCOPEAug 18, 21Jan 11, 24Not available
2023/0393,169 ARRANGEMENT FOR AND METHOD OF DETERMINING CANTILEVER DEFLECTION IN A SCANNING PROBE MICROSCOPY SYSTEMNov 03, 21Dec 07, 23Not available
2023/0020,068 METHOD AND DEVICE FOR SIMULTANEOUS INDEPENDENT MOTION MEASUREMENT OF MULTIPLE PROBES IN ATOMIC FORCE MICROSCOPEMay 08, 21Jan 19, 23Not available
2022/0357,359 INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZERMar 28, 22Nov 10, 22Not available
2022/0244,289 AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONINGFeb 02, 22Aug 04, 22Not available
2021/0311,091 SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE PROBE MICROSCOPEJul 27, 18Oct 07, 21Not available
2020/0191,827 MULTIPLE INTEGRATED TIPS SCANNING PROBE MICROSCOPEFeb 24, 20Jun 18, 20Xallent, LLC
2020/0141,970 SCANNING PROBE MICROSCOPEJun 28, 18May 07, 20Not available
2020/0124,635 HETERODYNE ATOMIC FORCE MICROSCOPY DEVICE, METHOD AND LITHOGRAPHIC SYSTEMJan 15, 18Apr 23, 20Not available
2020/0003,800 SCANNING PROBE MICROSCOPEFeb 22, 18Jan 02, 20Shimadzu Corporation
2019/0324,054 Metrological Scanning Probe MicroscopeJul 02, 19Oct 24, 19Not available

more results

Top Owners in This Subclass

Upgrade to the Professional Level to view Top Owners for this Subclass.Learn More

Patents Issued To Date - By Filing Year

Average Time to Issuance