Description
Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 20/00: Monitoring the movement or position of the probe
G01Q 20/00
Sub-Class
Stats
- 67 US PATENTS IN FORCE
- 7 US APPLICATIONS PENDING
- 34 Total Patent Owners
- 194 TOTAL INVENTORS
Recent Patents
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12188960 | Active noise isolation for tunneling applications (ANITA) | Jan 24, 19 | Jan 07, 25 | The Penn State Research Foundation |
| 12169208 | Probe tip X-Y location identification using a charged particle beam | Nov 29, 22 | Dec 17, 24 | Innovatum Instruments Inc. |
| 11656245 | Method and device for measuring dimension of semiconductor structure | Aug 03, 21 | May 23, 23 | Changxin Memory Technologies, Inc. |
| 11125773 | Apparatus and methods for quantum beam tracking | Jul 07, 20 | Sep 21, 21 | Xanadu Quantum Technologies Inc. |
| 11002757 | Method and apparatus of operating a scanning probe microscope | Dec 10, 19 | May 11, 21 | Bruker Nano, Inc. |
| 10775405 | Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element | Aug 31, 17 | Sep 15, 20 | Nederlandse Organisatie voor toegepast-natuuurwetenschappelijk onderzoek TNO |
| 10697998 | Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore | Oct 21, 16 | Jun 30, 20 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 10663483 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Jun 12, 18 | May 26, 20 | Bruker Nano, Inc. |
| 10502761 | Method and apparatus of operating a scanning probe microscope | Mar 03, 17 | Dec 10, 19 | Bruker Nano, Inc. |
| 10444258 | AM/FM measurements using multiple frequency atomic force microscopy | Dec 11, 17 | Oct 15, 19 | Oxford Instruments Asylum Research, Inc. |
| 10444486 | Systems and methods for detection of blank fields in digital microscopes | Sep 04, 17 | Oct 15, 19 | MICROSCOPES INTERNATIONAL, LLC |
| 10288643 | Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sample | Jul 14, 16 | May 14, 19 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 10215773 | Material property measurements using multiple frequency atomic force microscopy | Mar 08, 16 | Feb 26, 19 | Oxford Instruments AFM Inc |
| 10197596 | Method and apparatus of operating a scanning probe microscope | Nov 07, 17 | Feb 05, 19 | Bruker Nano, Inc. |
| 10161958 | Three-dimensional fine movement device | Jul 09, 15 | Dec 25, 18 | Hitachi High-Tech Science Corporation |
| 10145861 | Detection device having attached probe | Dec 29, 15 | Dec 04, 18 | Stromlinet Nano Limited |
| 10132830 | Method of measuring a topographic profile and/or a topographic image | Jan 19, 16 | Nov 20, 18 | ANTON PAAR TRITEC SA |
| 10060946 | Electron vibrometer and determining displacement of a cantilever | Mar 03, 17 | Aug 28, 18 | The United States of America as represented by the Secretary of Commerce |
| 10048289 | Motion sensor integrated nano-probe N/MEMS apparatus, method, and applications | Dec 17, 12 | Aug 14, 18 | Cornell University |
| 10025207 | Method of aligning a first article relative to a second article | May 06, 11 | Jul 17, 18 | Universität Kassel |
Recent Publications
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0280,605 | MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD | Feb 17, 23 | Aug 22, 24 | WINBOND ELECTRONICS CORP. |
| 2024/0118,310 | DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE | Jan 20, 22 | Apr 11, 24 | Not available |
| 2019/0227,097 | METHOD OF AND SYSTEM FOR PERFORMING DEFECT DETECTION ON OR CHARACTERIZATION OF A LAYER OF A SEMICONDUCTOR ELEMENT OR SEMI-MANUFACTURED SEMICONDUCTOR ELEMENT | Aug 31, 17 | Jul 25, 19 | Not available |
| 2019/0195,910 | Material Property Measurements Using Multiple Frequency Atomic Force Microscopy | Feb 26, 19 | Jun 27, 19 | Not available |
| 2019/0018,039 | MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONS | Jun 26, 18 | Jan 17, 19 | Cornell Research Foundation Inc. Cornell University |
| 2018/0306,837 | METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE, AND SCANNING PROBE MICROSCOPY SYSTEM THEREFORE | Oct 21, 16 | Oct 25, 18 | Not available |
Top Owners in This Subclass
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Patents Issued To Date - By Filing Year
Average Time to Issuance
- 25 Months (last 2 years Issuances)
- 25 Months (last 5 years Issuances)