Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 10/06: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning Circuits or algorithms therefor
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12253539 | Method of examining a sample in an atomic force microscope using attractive tip-to-sample interaction | Jul 13, 21 | Mar 18, 25 | CESKE VYSOKE UCENI TECHNICKE V PRAZE, FAKULTA STROJNI |
| 12055560 | Automated optimization of AFM light source positioning | Mar 21, 23 | Aug 06, 24 | Oxford Instruments Asylum Research, Inc. |
| 11994533 | Methods and systems for scanning probe sample property measurement and imaging | Nov 25, 20 | May 28, 24 | The Regents of the University of Colorado a Body Corporate |
| 11965910 | Device and method for operating a bending beam in a closed control loop | Mar 30, 23 | Apr 23, 24 | Carl Zeiss SMT GmbH |
| 11959936 | Scanning probe system | Nov 30, 20 | Apr 16, 24 | INFINITESIMA LIMITED |
| 11860188 | Probe for scanning probe microscope and binary state scanning probe microscope including the same | Mar 24, 22 | Jan 02, 24 | Industry-Academic Cooperation Foundation - Yonsei University |
| 11846653 | Scanning probe microscope and method for resonance-enhanced detection using a range of modulation frequencies | Dec 17, 20 | Dec 19, 23 | MOLECULAR VISTA, INC. |
| 11796563 | Apparatus and method for a scanning probe microscope | Jan 25, 22 | Oct 24, 23 | Carl Zeiss SMT GmbH |
| 11733265 | Method of imaging a surface using a scanning probe microscope | Oct 23, 20 | Aug 22, 23 | INFINITESIMA LIMITED |
| 11668730 | High speed atomic force profilometry of large areas | Apr 06, 21 | Jun 06, 23 | Bruker Nano, Inc. |
| 11656244 | Compensating control signal for raster scan of a scanning probe microscope | Nov 19, 20 | May 23, 23 | BRUKER NANO GMBH |
| 11604210 | AFM imaging with real time drift correction | Jul 08, 21 | Mar 14, 23 | Bruker Nano, Inc. |
| 11549964 | Phase-shift-based amplitude detector for a high-speed atomic force microscope | Feb 07, 22 | Jan 10, 23 | Cornell University |
| 11549963 | Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample | Sep 23, 19 | Jan 10, 23 | Interuniversitair Microelektronica Centrum (IMEC VZW); Katholieke Universiteit Leuven, KU LEUVEN R&D; |
| 11460527 | Method of observing objects using a spinning localized observation | Aug 29, 19 | Oct 04, 22 | Not available |
| 11402404 | Scanning probe microscope and a method for operating thereof | Aug 08, 19 | Aug 02, 22 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 11391755 | Scanning probe microscope and setting method thereof | Mar 16, 21 | Jul 19, 22 | HITACHI HIGH-TECH SCIENCE CORPORATION |
| 11320454 | Scanning probe microscopy system for and method of mapping nanostructures on the surface of a sample | May 14, 18 | May 03, 22 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 11320457 | System and method of performing scanning probe microscopy on a substrate surface | Jul 24, 19 | May 03, 22 | Nederlandse Organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO |
| 11243229 | Phase-shift-based amplitude detector for a high-speed atomic force microscope | Jul 23, 19 | Feb 08, 22 | Cornell University |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0067,769 | SCANNING PROBE MICROSCOPY SYSTEM AND METHOD OF OPERATING SUCH A SYSTEM | Dec 23, 22 | Feb 27, 25 | Not available |
| 2025/0004,010 | ATOMIC FORCE MICROSCOPE (AFM) DEVICE AND METHOD OF OPERATING THE SAME | Dec 23, 22 | Jan 02, 25 | Not available |
| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0402,215 | SCANNING PROBE MICROSCOPE AND PROGRAM | Mar 23, 22 | Dec 05, 24 | Not available |
| 2024/0230,709 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Mar 26, 24 | Jul 11, 24 | Not available |
| 2024/0210,443 | FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIP | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0210,444 | USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQUE IN A SALT FOG CORROSION TEST | Mar 12, 21 | Jun 27, 24 | Not available |
| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2022/0357,359 | INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER | Mar 28, 22 | Nov 10, 22 | Not available |
| 2022/0082,582 | METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICROSCOPES USING OUT-OF-BANDWIDTH FREQUENCY COMPONENTS ADDED TO BIAS VOLTAGE AND RELATED SOFTWARE | Sep 30, 21 | Mar 17, 22 | Not available |
| 2021/0311,090 | A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF | Aug 08, 19 | Oct 07, 21 | Not available |
| 2021/0190,818 | Measuring Device for a Scanning Probe Microscope and Method for Scanning Probe Microscopic Examination of a Measurement Sample with a Scanning Probe Microscope | Nov 19, 20 | Jun 24, 21 | Not available |
| 2020/0141,970 | SCANNING PROBE MICROSCOPE | Jun 28, 18 | May 07, 20 | Not available |
| 2020/0116,480 | SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING SYSTEM, MACHINE LEARNING DEVICE, AND PREDICTION DEVICE | Oct 08, 19 | Apr 16, 20 | Not available |
| 2020/0081,032 | ATOMIC FORCE MICROSCOPE, ATOMIC FORCE MICROSCOPY, AND CONTROLLING METHOD OF AN ATOMIC FORCE MICROSCOPY | Nov 13, 19 | Mar 12, 20 | OLYMPUS CORPORATION |
| 2019/0353,679 | HIGH-PRECISION SCANNING DEVICE | Nov 17, 17 | Nov 21, 19 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 2019/0293,680 | SCANNING PROBE MICROSCOPE | Jun 02, 16 | Sep 26, 19 | Shimadzu Corporation |
| 2019/0094,265 | AFM with Suppressed Parasitic Signals | Jan 26, 17 | Mar 28, 19 | Not available |
| 2019/0094,266 | A METHOD OF OPERATING AN AFM | Apr 26, 17 | Mar 28, 19 | Not available |
| 2019/0094,267 | METHOD OF CONTROLLING A PROBE | Sep 25, 18 | Mar 28, 19 | CONCEPT SCIENTIFIQUE INSTRUMENTS |
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