Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 10/04: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12266501 | Nanopositioning systems and associated methods | Nov 27, 20 | Apr 01, 25 | The Texas A&M University System |
| 12247998 | Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes | Sep 22, 22 | Mar 11, 25 | The Research Foundation for the State University of New York; Yale University; |
| 12241911 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Feb 02, 24 | Mar 04, 25 | BRUKER NANO, INC. |
| 12188924 | Methods and systems for analyte detection and analysis | Jul 20, 23 | Jan 07, 25 | ULTIMA GENOMICS, INC. |
| 12174218 | Atomic nano-positioning device | Aug 31, 20 | Dec 24, 24 | National Research Council of Canada; The Governors of the University of Alberta; |
| 12165863 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | Sep 18, 23 | Dec 10, 24 | NOVA MEASURING INSTRUMENTS, INC. |
| 11973441 | MEMS nanopositioner and method of fabrication | Dec 20, 21 | Apr 30, 24 | 501 Board of Regents The University of Texas System |
| 11940461 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Apr 11, 23 | Mar 26, 24 | BRUKER NANO, INC. |
| 11906546 | Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging | Jul 06, 20 | Feb 20, 24 | Massachusetts Institute of Technology; Nano Analytik GMBH; Synsfuels Americas Corporation; |
| 11852654 | Cantilever with a collocated piezoelectric actuator-sensor pair | Jul 17, 20 | Dec 26, 23 | 501 Board of Regents The University of Texas System |
| 11796563 | Apparatus and method for a scanning probe microscope | Jan 25, 22 | Oct 24, 23 | Carl Zeiss SMT GmbH |
| 11789037 | Integrated dual-probe rapid in-situ switching measurement method and device of atomic force microscope | May 08, 21 | Oct 17, 23 | Shenyang Institute of Automation, Chinese Academy of Sciences |
| 11764050 | Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry | Aug 23, 22 | Sep 19, 23 | NOVA MEASURING INSTRUMENTS INC. |
| 11747323 | Methods and systems for analyte detection and analysis | Oct 07, 22 | Sep 05, 23 | ULTIMA GENOMICS, INC. |
| 11733265 | Method of imaging a surface using a scanning probe microscope | Oct 23, 20 | Aug 22, 23 | INFINITESIMA LIMITED |
| 11733264 | Cantilever, scanning probe microscope, and measurement method using scanning probe microscope | Apr 30, 20 | Aug 22, 23 | HITACHI HIGH-TECH CORPORATION |
| 11714104 | AFM imaging with creep correction | May 25, 21 | Aug 01, 23 | Bruker Nano, Inc. |
| 11709180 | Atomic force microscope using artificial intelligence object recognition technology and operation method thereof | May 11, 21 | Jul 25, 23 | Chungbuk National University Industry Academic Cooperation Foundation |
| 11619649 | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same | Nov 26, 21 | Apr 04, 23 | Park Systems Corp. |
| 11592460 | Scanning probe microscope, scan head and method | Dec 03, 19 | Feb 28, 23 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0076,339 | SCANNING METHOD AND DEVICE FOR SCANNING PROBE MICROSCOPE BASED ON HIGH-SPEED INSTANTANEOUS FORCE CONTROL | Mar 09, 23 | Mar 06, 25 | Not available |
| 2025/0067,768 | ELEMENT OF AN AFM TOOL | Dec 22, 22 | Feb 27, 25 | ASML Netherlands B.V. |
| 2025/0012,778 | METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS | Jul 17, 24 | Jan 09, 25 | Not available |
| 2024/0369,595 | LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE | Jun 10, 22 | Nov 07, 24 | Not available |
| 2024/0168,052 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Mar 26, 21 | May 23, 24 | Not available |
| 2024/0094,240 | OPTOMECHANICAL TRANSDUCER | Jan 21, 22 | Mar 21, 24 | Not available |
| 2024/0069,095 | DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE MICROSCOPY | Aug 26, 22 | Feb 29, 24 | Not available |
| 2022/0252,638 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | Apr 18, 22 | Aug 11, 22 | BRUKER NANO, INC. |
| 2022/0244,288 | COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OPAQUE LIQUID ENVIRONMENTS, AND METHODS OF PERFORMING TOPOGRAPHY IMAGING | Jul 06, 20 | Aug 04, 22 | Not available |
| 2022/0244,287 | Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating | Jun 18, 20 | Aug 04, 22 | Not available |
| 2021/0302,465 | SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCANNING PROBE MICROSCOPE | Dec 24, 20 | Sep 30, 21 | Not available |
| 2021/0096,152 | MICRO-OPTOMECHANICAL SYSTEM AND METHOD FOR THE PRODUCTION THEREOF | Dec 04, 18 | Apr 01, 21 | Karlsruher Institut für Technologie |
| 2020/0141,970 | SCANNING PROBE MICROSCOPE | Jun 28, 18 | May 07, 20 | Not available |
| 2019/0324,053 | SCANNING PROBE MICROSCOPE | Mar 01, 19 | Oct 24, 19 | Not available |
| 2019/0277,881 | METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOMOGRAPHY | Mar 07, 19 | Sep 12, 19 | Not available |
| 2019/0187,173 | NOZZLE INSPECTION METHOD AND APPARATUS | Aug 29, 18 | Jun 20, 19 | Not available |
| 2018/0321,276 | METROLOGY DEVICES AND METHODS FOR INDEPENDENTLY CONTROLLING A PLURALITY OF SENSING PROBES | Nov 03, 16 | Nov 08, 18 | Not available |
| 2017/0350,920 | SCANNING PROBE MICROSCOPE | Oct 24, 14 | Dec 07, 17 | SHIMADZU CORPORATION |
| 2017/0299,584 | SELF-SENSING ARRAY OF MICROCANTILEVERS FOR CHEMICAL DETECTION | Jun 29, 17 | Oct 19, 17 | BOARD OF REGENTS OF THE NEVADA SYSTEM OF HIGHER EDUCATION, ON BEHALF OF THE UNIVERSITY OF NEVADA, RENO |
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